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Pisma v Zhurnal Tekhnicheskoi Fiziki, 2016, Volume 42, Issue 3, Pages 52–60
(Mi pjtf6518)
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This article is cited in 2 scientific papers (total in 2 papers)
Specific features of nonequilibrium depletion accompanied by the trapping of minority carriers by surface states in metal–insulator–semiconductor structures
S. V. Tikhov, O. N. Gorshkov, M. N. Koryazhkina, I. N. Antonov, A. P. Kasatkin Lobachevsky State University of Nizhny Novgorod
Abstract:
Specific features (abrupt changes in current caused by voltage variation) of nonequilibrium depletion in metal–insulator–semiconductor structures based on gallium arsenide and silicon with a 40-nm-thick film of yttria-stabilized zirconia were revealed. These features may help extend the range of application of the nonequilibrium depletion effect in microelectronics.
Keywords:
GaAs, Technical Physic Letter, Sweep Rate, Gallium Arsenide, Resistive Switching.
Received: 31.03.2015
Citation:
S. V. Tikhov, O. N. Gorshkov, M. N. Koryazhkina, I. N. Antonov, A. P. Kasatkin, “Specific features of nonequilibrium depletion accompanied by the trapping of minority carriers by surface states in metal–insulator–semiconductor structures”, Pisma v Zhurnal Tekhnicheskoi Fiziki, 42:3 (2016), 52–60; Tech. Phys. Lett., 42:2 (2016), 138–142
Linking options:
https://www.mathnet.ru/eng/pjtf6518 https://www.mathnet.ru/eng/pjtf/v42/i3/p52
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Abstract page: | 30 | Full-text PDF : | 5 |
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