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Pisma v Zhurnal Tekhnicheskoi Fiziki, 2016, Volume 42, Issue 4, Pages 9–15 (Mi pjtf6497)  

This article is cited in 1 scientific paper (total in 1 paper)

Scanning near-field optical nanotomography: a new method of multiparametric 3D investigation of nanostructural materials

A. E. Efimovab, A. Yu. Bobrovskyc, I. I. Agapova, O. I. Agapovaa, V. A. Oleĭnikovde, I. R. Nabievef, K. E. Mochalovde

a Research Institute of Transplantology and Artificial Organs, Moscow
b SNOTRA Company, Moscow, Russia
c Lomonosov Moscow State University
d M. M. Shemyakin and Yu. A. Ovchinnikov Institute of Bioorganic Chemistry of the Russian Academy of Sciences, Moscow
e National Engineering Physics Institute "MEPhI", Moscow
f Laboratory of Research in Nanosciences, Université de Reims Champagne–Ardenne, Reims, France
Full-text PDF (556 kB) Citations (1)
Abstract: A new experimental approach to multiparametric three-dimensional (3D) investigation of a broad class of composite nanostructural materials is developed on the basis of scanning near-field optical nanotomography (SNONT). Using this method, it is possible to simultaneously study the optical properties, 3D morphology, and distribution of the mechanical and electrical properties of the same region of a sample. The proposed method combines features of the confocal and near-field optical microspectroscopy (fluorescence and Raman spectroscopy) with a lateral resolution of up to 50 nm and scanning-probe microscopy. The possibility of studying the volume distribution of optical, morphological, electrical, and mechanical characteristics of a material with nanoscale resolution is related to the probing of sequential layers at a step of up to 20 nm and a total Z-scan depth of up to 3 mm. In particular, the SNONT method has been used to study a liquid-crystalline polymer doped with fluorescent nanocrystals.
Keywords: Technical Physic Letter, Correlation Microscopy, Cantilever Probe, Nanoscale Resolution, Hybrid Nanostructural Material.
Received: 09.10.2015
English version:
Technical Physics Letters, 2016, Volume 42, Issue 2, Pages 171–174
DOI: https://doi.org/10.1134/S1063785016020231
Bibliographic databases:
Document Type: Article
Language: Russian
Citation: A. E. Efimov, A. Yu. Bobrovsky, I. I. Agapov, O. I. Agapova, V. A. Oleǐnikov, I. R. Nabiev, K. E. Mochalov, “Scanning near-field optical nanotomography: a new method of multiparametric 3D investigation of nanostructural materials”, Pisma v Zhurnal Tekhnicheskoi Fiziki, 42:4 (2016), 9–15; Tech. Phys. Lett., 42:2 (2016), 171–174
Citation in format AMSBIB
\Bibitem{EfiBobAga16}
\by A.~E.~Efimov, A.~Yu.~Bobrovsky, I.~I.~Agapov, O.~I.~Agapova, V.~A.~Ole{\v\i}nikov, I.~R.~Nabiev, K.~E.~Mochalov
\paper Scanning near-field optical nanotomography: a new method of multiparametric 3D investigation of nanostructural materials
\jour Pisma v Zhurnal Tekhnicheskoi Fiziki
\yr 2016
\vol 42
\issue 4
\pages 9--15
\mathnet{http://mi.mathnet.ru/pjtf6497}
\elib{https://elibrary.ru/item.asp?id=25669720}
\transl
\jour Tech. Phys. Lett.
\yr 2016
\vol 42
\issue 2
\pages 171--174
\crossref{https://doi.org/10.1134/S1063785016020231}
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  • https://www.mathnet.ru/eng/pjtf/v42/i4/p9
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    Pisma v Zhurnal Tekhnicheskoi Fiziki Pisma v Zhurnal Tekhnicheskoi Fiziki
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