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Pisma v Zhurnal Tekhnicheskoi Fiziki, 2016, Volume 42, Issue 8, Pages 78–85
(Mi pjtf6447)
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This article is cited in 1 scientific paper (total in 1 paper)
An electron-impact ionization study of molecular selenium beams
A. N. Zavilopulo, O. B. Shpenik, M. I. Mykyta, A. M. Mylymko Institute of Electron Physics, National Academy of Sciences of Ukraine, Uzhgorod, Ukraine
Abstract:
We describe the method and presents results of a mass-spectrometric investigation of the yield of positive ions formed as a result of the dissociative ionization of a molecular selenium beam by electron impact. Appearance energies of fragment ions have been determined from the ionization efficiency curves. The dynamics of formation of the molecular ions of selenium in a temperature interval of 420–495 K has been studied. The energy dependences of the efficiency of formation of singly charged Sе$_{n}^{+}$ ($n$ = 1–3) and doubly charged Se$^{++}$ ions are analyzed.
Keywords:
Selenium, Technical Physic Letter, Dissociative Ionization, Chalcogen, Appearance Energy.
Received: 04.08.2015
Citation:
A. N. Zavilopulo, O. B. Shpenik, M. I. Mykyta, A. M. Mylymko, “An electron-impact ionization study of molecular selenium beams”, Pisma v Zhurnal Tekhnicheskoi Fiziki, 42:8 (2016), 78–85; Tech. Phys. Lett., 42:4 (2016), 427–430
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https://www.mathnet.ru/eng/pjtf6447 https://www.mathnet.ru/eng/pjtf/v42/i8/p78
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