Electron-stimulated desorption of cesium atoms from graphene-covered iridium

Electron-stimulated desorption (ESD) of cesium atoms from graphene on a metal (iridium) substrate has been directly observed for the first time using the time-of-flight technique with a surface-ionization detector. The appearance threshold of the yield of Cs atoms from the sample surface at 160 K was 20 eV. An additional ESD peak of Cs atoms was observed at an electron energy of 56 eV. The observed ESD of Cs atoms from graphene is related to the nonmetal nature of this carbon film on the metal substrate surface.