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Pisma v Zhurnal Tekhnicheskoi Fiziki, 2018, Volume 44, Issue 13, Pages 88–95
DOI: https://doi.org/10.21883/PJTF.2018.13.46332.17304 (Mi pjtf5768) 		 
This article is cited in 5 scientific papers (total in 5 papers)

Electrical and magnetic properties of ultrathin polycrystalline Fe films grown on SiO$_{2}$/Si(001)

V. V. Balashevab, K. S. Ermakovb, L. A. Chebotkevichb, V. V. Korobtsovab

a Institute for Automation and Control Processes, Far Eastern Branch of the Russian Academy of Sciences, Vladivostok
b School of Natural Sciences, Far Eastern Federal University, Vladivostok
Full-text PDF (711 kB) Citations (5)
DOI: https://doi.org/10.21883/PJTF.2018.13.46332.17304
Abstract: Ultrathin polycrystalline Fe films have been grown on the oxidized surface of a Si(001) substrate. The resistivity and magnetic hysteresis of Fe films have been measured in the range of thickness from 2.5 to 10 nm. Based on the analysis of the data obtained, it is suggested that there is a transition to the structurally continuous film at a thickness of $\sim$6 nm. It is found that Fe grains in this film acquire the preferred (111) orientation during this transition.
Funding agency Grant number
Russian Academy of Sciences - Federal Agency for Scientific Organizations 18-3-022
Received: 20.03.2018
English version:
Technical Physics Letters, 2018, Volume 44, Issue 7, Pages 595–598
DOI: https://doi.org/10.1134/S1063785018070040
Bibliographic databases:
Document Type: Article
Language: Russian
Citation: V. V. Balashev, K. S. Ermakov, L. A. Chebotkevich, V. V. Korobtsov, “Electrical and magnetic properties of ultrathin polycrystalline Fe films grown on SiO$_{2}$/Si(001)”, Pisma v Zhurnal Tekhnicheskoi Fiziki, 44:13 (2018), 88–95; Tech. Phys. Lett., 44:7 (2018), 595–598
Citation in format AMSBIB
\Bibitem{BalErmChe18}
\by V.~V.~Balashev, K.~S.~Ermakov, L.~A.~Chebotkevich, V.~V.~Korobtsov
\paper Electrical and magnetic properties of ultrathin polycrystalline Fe films grown on SiO$_{2}$/Si(001)
\jour Pisma v Zhurnal Tekhnicheskoi Fiziki
\yr 2018
\vol 44
\issue 13
\pages 88--95
\mathnet{http://mi.mathnet.ru/pjtf5768}
\crossref{https://doi.org/10.21883/PJTF.2018.13.46332.17304}
\elib{https://elibrary.ru/item.asp?id=35270663}
\transl
\jour Tech. Phys. Lett.
\yr 2018
\vol 44
\issue 7
\pages 595--598
\crossref{https://doi.org/10.1134/S1063785018070040}
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    • This publication is cited in the following 5 articles:
    Citing articles in Google Scholar: Russian citations, English citations
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