Pisma v Zhurnal Tekhnicheskoi Fiziki
RUS  ENG    JOURNALS   PEOPLE   ORGANISATIONS   CONFERENCES   SEMINARS   VIDEO LIBRARY   PACKAGE AMSBIB  
General information
Latest issue
Archive
Guidelines for authors

Search papers
Search references

RSS
Latest issue
Current issues
Archive issues
What is RSS


Pisma v Zhurnal Tekhnicheskoi Fiziki:
Year:
Volume:
Issue:
Page:
Find




Personal entry:
Login:
Password:
Save password
Enter
Forgotten password?
Register

Pisma v Zhurnal Tekhnicheskoi Fiziki, 2018, Volume 44, Issue 16, Pages 89–95
DOI: https://doi.org/10.21883/PJTF.2018.16.46481.17212 (Mi pjtf5726) 		 
This article is cited in 1 scientific paper (total in 1 paper)

Measuring the extinction index of dielectric films using frustrated total internal reflectance spectroscopy

V. B. Nguyen, L. A. Gubanova

St. Petersburg National Research University of Information Technologies, Mechanics and Optics
Full-text PDF (132 kB) Citations (1)
DOI: https://doi.org/10.21883/PJTF.2018.16.46481.17212
Abstract: Various methods of measuring the coefficient of light attenuation in optical coatings are considered. It is shown that the dimensionless extinction index of a coating made of a weakly absorbing film-forming material can be measured using a special attachment based on a parallelepiped-shaped optical prism. Parameters of the proposed attachment are calculated so that it could be arranged inside standard spectrophotometers.
Received: 16.01.2018
English version:
Technical Physics Letters, 2018, Volume 44, Issue 8, Pages 746–748
DOI: https://doi.org/10.1134/S1063785018080278
Bibliographic databases:
Document Type: Article
Language: Russian
Citation: V. B. Nguyen, L. A. Gubanova, “Measuring the extinction index of dielectric films using frustrated total internal reflectance spectroscopy”, Pisma v Zhurnal Tekhnicheskoi Fiziki, 44:16 (2018), 89–95; Tech. Phys. Lett., 44:8 (2018), 746–748
Citation in format AMSBIB
\Bibitem{NguGub18}
\by V.~B.~Nguyen, L.~A.~Gubanova
\paper Measuring the extinction index of dielectric films using frustrated total internal reflectance spectroscopy
\jour Pisma v Zhurnal Tekhnicheskoi Fiziki
\yr 2018
\vol 44
\issue 16
\pages 89--95
\mathnet{http://mi.mathnet.ru/pjtf5726}
\crossref{https://doi.org/10.21883/PJTF.2018.16.46481.17212}
\elib{https://elibrary.ru/item.asp?id=35270718}
\transl
\jour Tech. Phys. Lett.
\yr 2018
\vol 44
\issue 8
\pages 746--748
\crossref{https://doi.org/10.1134/S1063785018080278}
Linking options:
  • https://www.mathnet.ru/eng/pjtf5726
  • https://www.mathnet.ru/eng/pjtf/v44/i16/p89
    • This publication is cited in the following 1 articles:
    Citing articles in Google Scholar: Russian citations, English citations
    Related articles in Google Scholar: Russian articles, English articles
    		Pisma v Zhurnal Tekhnicheskoi Fiziki Pisma v Zhurnal Tekhnicheskoi Fiziki
    Statistics & downloads:
    Abstract page:40
    Full-text PDF :11
     
      Contact us:
    		  Terms of Use  Registration to the website  Logotypes © Steklov Mathematical Institute RAS, 2024