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Pisma v Zhurnal Tekhnicheskoi Fiziki, 2018, Volume 44, Issue 21, Pages 3–9
DOI: https://doi.org/10.21883/PJTF.2018.21.46849.17418 (Mi pjtf5645) 		 
This article is cited in 3 scientific papers (total in 3 papers)

Intracavity waveguide spectroscopy of thin films

A. V. Shulga, A. V. Khomchenko, I. V. Shilova

Belarusian-Russian University, Mogilev, Belarus
Full-text PDF (175 kB) Citations (3)
DOI: https://doi.org/10.21883/PJTF.2018.21.46849.17418
Abstract: The method of intracavity waveguide spectroscopy for measuring low optical losses in thin films is proposed. The method also allows one to distinguish transverse and longitudinal modes in low-gain lasers without introducing considerable losses into the cavity.
Received: 05.06.2018
English version:
Technical Physics Letters, 2018, Volume 44, Issue 11, Pages 953–955
DOI: https://doi.org/10.1134/S1063785018110159
Bibliographic databases:
Document Type: Article
Language: Russian
Citation: A. V. Shulga, A. V. Khomchenko, I. V. Shilova, “Intracavity waveguide spectroscopy of thin films”, Pisma v Zhurnal Tekhnicheskoi Fiziki, 44:21 (2018), 3–9; Tech. Phys. Lett., 44:11 (2018), 953–955
Citation in format AMSBIB
\Bibitem{ShuKhoShi18}
\by A.~V.~Shulga, A.~V.~Khomchenko, I.~V.~Shilova
\paper Intracavity waveguide spectroscopy of thin films
\jour Pisma v Zhurnal Tekhnicheskoi Fiziki
\yr 2018
\vol 44
\issue 21
\pages 3--9
\mathnet{http://mi.mathnet.ru/pjtf5645}
\crossref{https://doi.org/10.21883/PJTF.2018.21.46849.17418}
\elib{https://elibrary.ru/item.asp?id=36905909}
\transl
\jour Tech. Phys. Lett.
\yr 2018
\vol 44
\issue 11
\pages 953--955
\crossref{https://doi.org/10.1134/S1063785018110159}
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    • This publication is cited in the following 3 articles:
    Citing articles in Google Scholar: Russian citations, English citations
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    		Pisma v Zhurnal Tekhnicheskoi Fiziki Pisma v Zhurnal Tekhnicheskoi Fiziki
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