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This article is cited in 7 scientific papers (total in 7 papers)
Specific features of the current–voltage characteristic of microdisk lasers based on InGaAs/GaAs quantum well-dots
F. I. Zubova, È. I. Moiseeva, G. O. Kornyshova, N. V. Kryzhanovskayaa, Yu. M. Shernyakovb, A. S. Payusovb, M. M. Kulaginab, N. A. Kalyuzhnyyb, S. A. Mintairovb, M. V. Maksimova, A. E. Zhukova a Alferov Federal State Budgetary Institution of Higher Education and Science Saint Petersburg National Research Academic University of the Russian Academy of Sciences, St. Petersburg
b Ioffe Institute, St. Petersburg
Abstract:
Injection microlasers with an active region based on arrays of InGaAs/GaAs quantum well-dots, formed by deep etching, have been studied. The manner in which the current–voltage characteristic changes when the diameter microlaser is reduced shows that a nonelectrically conducting layer with thickness of about 1.5 $\mu$m is formed near the side surface, which leads to a decrease in the effective current flow area.
Keywords:
diode laser, microlaser, quantum dots, current-voltage characteristic.
Received: 19.06.2019 Revised: 19.06.2019 Accepted: 20.06.2019
Citation:
F. I. Zubov, È. I. Moiseev, G. O. Kornyshov, N. V. Kryzhanovskaya, Yu. M. Shernyakov, A. S. Payusov, M. M. Kulagina, N. A. Kalyuzhnyy, S. A. Mintairov, M. V. Maksimov, A. E. Zhukov, “Specific features of the current–voltage characteristic of microdisk lasers based on InGaAs/GaAs quantum well-dots”, Pisma v Zhurnal Tekhnicheskoi Fiziki, 45:19 (2019), 37–39; Tech. Phys. Lett., 45:10 (2019), 994–996
Linking options:
https://www.mathnet.ru/eng/pjtf5308 https://www.mathnet.ru/eng/pjtf/v45/i19/p37
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