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This article is cited in 2 scientific papers (total in 2 papers)
The influence of fin shape on the amplitude of random telegraph noise in the subthreshold regime of a junctionless FinFET
M. M. Khalilloeva, B. O. Jabbarovaa, A. A. Nasirovb a Urgench State University, Urgench, Uzbekistan
b National University of Uzbekistan named after Mirzo Ulugbek, Tashkent
Abstract:
The dependence of random telegraph noise (RTN) amplitude on the gate overdrive in a junctionless field-effect transistor (FinFET) with rectangular and trapezoidal channel (fin) cross sections manufactured using silicon-on-insulator technology has been numerically simulated. It is established that the RTN amplitude in the subthreshold region of gate voltages for a FinFET with a trapezoidal cross section of channel is significantly lower than that for the transistor with rectangular cross section of a channel. In addition, under the same conditions, the RTN amplitude at the threshold gate voltage in a junctionless FinFET is significantly lower than that in planar fully depleted and in usual FinFET.
Keywords:
random telegraph noise, junctionless FinFET, interfacial trap charge, drain current density.
Received: 03.09.2019 Revised: 03.09.2019 Accepted: 17.09.2019
Citation:
M. M. Khalilloev, B. O. Jabbarova, A. A. Nasirov, “The influence of fin shape on the amplitude of random telegraph noise in the subthreshold regime of a junctionless FinFET”, Pisma v Zhurnal Tekhnicheskoi Fiziki, 45:24 (2019), 29–32; Tech. Phys. Lett., 45:12 (2019), 1245–1248
Linking options:
https://www.mathnet.ru/eng/pjtf5238 https://www.mathnet.ru/eng/pjtf/v45/i24/p29
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Abstract page: | 46 | Full-text PDF : | 21 |
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