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This article is cited in 2 scientific papers (total in 2 papers)
Quantum yield of a silicon XUV avalanche photodiode in the 320–1100 nm wavelength range
V. V. Zabrodskii, P. N. Aruev, B. Ya. Ber, D. Yu. Kazantsev, A. N. Gorokhov, A. V. Nikolaev, V. V. Filimonov, M. Z. Shvarts, E. V. Sherstnev Ioffe Institute, St. Petersburg
Abstract:
Quantum photoresponse yield of a silicon XUV avalanche photodiode prototype with 1.5-mm-diameter active region has been studied in the 320–1100 nm wavelength range. It is established that the proposed avalanche photodiode has the external quantum efficiency above 20 electron/photon in the 580–1000 nm range at a reverse bias voltage of 485 V.
Keywords:
avalanche photodiode, XUV range, silicon, dark current.
Received: 23.04.2019 Revised: 11.09.2019 Accepted: 11.09.2019
Citation:
V. V. Zabrodskii, P. N. Aruev, B. Ya. Ber, D. Yu. Kazantsev, A. N. Gorokhov, A. V. Nikolaev, V. V. Filimonov, M. Z. Shvarts, E. V. Sherstnev, “Quantum yield of a silicon XUV avalanche photodiode in the 320–1100 nm wavelength range”, Pisma v Zhurnal Tekhnicheskoi Fiziki, 45:24 (2019), 10–13; Tech. Phys. Lett., 45:12 (2019), 1226–1229
Linking options:
https://www.mathnet.ru/eng/pjtf5233 https://www.mathnet.ru/eng/pjtf/v45/i24/p10
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Abstract page: | 65 | Full-text PDF : | 27 |
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