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This article is cited in 7 scientific papers (total in 7 papers)
Hydride vapor-phase epitaxy of a semipolar AlN(10$\bar{1}$2) layer on a nanostructured Si(100) substrate
V. N. Bessolov, M. E. Kompan, E. V. Konenkova, V. N. Panteleev Ioffe Institute, St. Petersburg
Abstract:
We propose a method for the synthesis of hexagonal AlN layer on Si(100) substrate with a $V$-groove nanostructured surface where the angle between the sloped nanoridge surface and Si(100) plane amounts to 47$^\circ$. It is established that metalorganic hydride vapor-phase epitaxy (HVPE) on this substrate leads to the formation of semipolar AlN(10$\bar{1}$2) layers having an X-ray rocking curve with a minimum FWHM value of $\omega_\theta\sim$ 60 arcmin. Raman spectra of this epilayer display additional peaks related to $A_1$(TO) and $E_1$(TO) phonons in contrast to the spectrum of a polar AlN(0001) layer containing an additional $A_1$(LO) peak.
Keywords:
semipolar aluminum nitride, hydride vapor-phase epitaxy, Raman spectroscopy.
Received: 07.10.2019 Revised: 07.10.2019 Accepted: 10.10.2019
Citation:
V. N. Bessolov, M. E. Kompan, E. V. Konenkova, V. N. Panteleev, “Hydride vapor-phase epitaxy of a semipolar AlN(10$\bar{1}$2) layer on a nanostructured Si(100) substrate”, Pisma v Zhurnal Tekhnicheskoi Fiziki, 46:2 (2020), 12–14; Tech. Phys. Lett., 46:1 (2020), 59–61
Linking options:
https://www.mathnet.ru/eng/pjtf5206 https://www.mathnet.ru/eng/pjtf/v46/i2/p12
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