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Pisma v Zhurnal Tekhnicheskoi Fiziki, 2020, Volume 46, Issue 3, Pages 6–9
DOI: https://doi.org/10.21883/PJTF.2020.03.48983.18014 (Mi pjtf5192) 		 
The effect of $d$-element traces on the electronic structure of cathodes in microwave devices

V. I. Kapustina, I. P. Lib, A. V. Shumanovab, S. O. Moskalenkoab, R. R. Zalyalyeva, N. E. Kozhevnikovab

a MIREA — Russian Technological University, Moscow
b JSC Pluton, Moscow
Full-text PDF (116 kB)
DOI: https://doi.org/10.21883/PJTF.2020.03.48983.18014
Abstract: It has been experimentally established for the first time using electron spectroscopy for chemical analysis that traces of $d$ elements (W, Re, Ni, Pd, and Os) in BaO crystallites contained in cathodes of microwave devices lead to the formation of the donor surface states on the crystallite surface, which can partially compensate the acceptor surface states caused by surface oxygen vacancies, which reduces the potential barrier on the crystallite surface and, consequently, the cathode work function.
Keywords: cathodes of microwave devices, barium oxide crystallites, $d$-element traces, donor and acceptor surface states.
Received: 15.08.2019
Revised: 15.08.2019
Accepted: 28.10.2019
English version:
Technical Physics Letters, 2020, Volume 46, Issue 2, Pages 106–109
DOI: https://doi.org/10.1134/S1063785020020066
Bibliographic databases:
Document Type: Article
Language: Russian
Citation: V. I. Kapustin, I. P. Li, A. V. Shumanov, S. O. Moskalenko, R. R. Zalyalyev, N. E. Kozhevnikova, “The effect of $d$-element traces on the electronic structure of cathodes in microwave devices”, Pisma v Zhurnal Tekhnicheskoi Fiziki, 46:3 (2020), 6–9; Tech. Phys. Lett., 46:2 (2020), 106–109
Citation in format AMSBIB
\Bibitem{KapLiShu20}
\by V.~I.~Kapustin, I.~P.~Li, A.~V.~Shumanov, S.~O.~Moskalenko, R.~R.~Zalyalyev, N.~E.~Kozhevnikova
\paper The effect of $d$-element traces on the electronic structure of cathodes in microwave devices
\jour Pisma v Zhurnal Tekhnicheskoi Fiziki
\yr 2020
\vol 46
\issue 3
\pages 6--9
\mathnet{http://mi.mathnet.ru/pjtf5192}
\crossref{https://doi.org/10.21883/PJTF.2020.03.48983.18014}
\elib{https://elibrary.ru/item.asp?id=42776898}
\transl
\jour Tech. Phys. Lett.
\yr 2020
\vol 46
\issue 2
\pages 106--109
\crossref{https://doi.org/10.1134/S1063785020020066}
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