Pisma v Zhurnal Tekhnicheskoi Fiziki
RUS  ENG    JOURNALS   PEOPLE   ORGANISATIONS   CONFERENCES   SEMINARS   VIDEO LIBRARY   PACKAGE AMSBIB  
General information
Latest issue
Archive
Guidelines for authors

Search papers
Search references

RSS
Latest issue
Current issues
Archive issues
What is RSS


Pisma v Zhurnal Tekhnicheskoi Fiziki:
Year:
Volume:
Issue:
Page:
Find




Personal entry:
Login:
Password:
Save password
Enter
Forgotten password?
Register

Pisma v Zhurnal Tekhnicheskoi Fiziki, 2020, Volume 46, Issue 3, Pages 6–9
DOI: https://doi.org/10.21883/PJTF.2020.03.48983.18014 (Mi pjtf5192) 		 
The effect of $d$-element traces on the electronic structure of cathodes in microwave devices

V. I. Kapustina, I. P. Lib, A. V. Shumanovab, S. O. Moskalenkoab, R. R. Zalyalyeva, N. E. Kozhevnikovab

a MIREA — Russian Technological University, Moscow
b JSC Pluton, Moscow
Full-text PDF (116 kB)
DOI: https://doi.org/10.21883/PJTF.2020.03.48983.18014
Abstract: It has been experimentally established for the first time using electron spectroscopy for chemical analysis that traces of $d$ elements (W, Re, Ni, Pd, and Os) in BaO crystallites contained in cathodes of microwave devices lead to the formation of the donor surface states on the crystallite surface, which can partially compensate the acceptor surface states caused by surface oxygen vacancies, which reduces the potential barrier on the crystallite surface and, consequently, the cathode work function.
Keywords: cathodes of microwave devices, barium oxide crystallites, $d$-element traces, donor and acceptor surface states.
Received: 15.08.2019
Revised: 15.08.2019
Accepted: 28.10.2019
English version:
Technical Physics Letters, 2020, Volume 46, Issue 2, Pages 106–109
DOI: https://doi.org/10.1134/S1063785020020066
Bibliographic databases:
Document Type: Article
Language: Russian
Citation: V. I. Kapustin, I. P. Li, A. V. Shumanov, S. O. Moskalenko, R. R. Zalyalyev, N. E. Kozhevnikova, “The effect of $d$-element traces on the electronic structure of cathodes in microwave devices”, Pisma v Zhurnal Tekhnicheskoi Fiziki, 46:3 (2020), 6–9; Tech. Phys. Lett., 46:2 (2020), 106–109
Citation in format AMSBIB
\Bibitem{KapLiShu20}
\by V.~I.~Kapustin, I.~P.~Li, A.~V.~Shumanov, S.~O.~Moskalenko, R.~R.~Zalyalyev, N.~E.~Kozhevnikova
\paper The effect of $d$-element traces on the electronic structure of cathodes in microwave devices
\jour Pisma v Zhurnal Tekhnicheskoi Fiziki
\yr 2020
\vol 46
\issue 3
\pages 6--9
\mathnet{http://mi.mathnet.ru/pjtf5192}
\crossref{https://doi.org/10.21883/PJTF.2020.03.48983.18014}
\elib{https://elibrary.ru/item.asp?id=42776898}
\transl
\jour Tech. Phys. Lett.
\yr 2020
\vol 46
\issue 2
\pages 106--109
\crossref{https://doi.org/10.1134/S1063785020020066}
Linking options:
  • https://www.mathnet.ru/eng/pjtf5192
  • https://www.mathnet.ru/eng/pjtf/v46/i3/p6
    • Citing articles in Google Scholar: Russian citations, English citations
    Related articles in Google Scholar: Russian articles, English articles
    		Pisma v Zhurnal Tekhnicheskoi Fiziki Pisma v Zhurnal Tekhnicheskoi Fiziki
    Statistics & downloads:
    Abstract page:36
    Full-text PDF :18
     
      Contact us:
    		  Terms of Use  Registration to the website  Logotypes © Steklov Mathematical Institute RAS, 2024