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Pisma v Zhurnal Tekhnicheskoi Fiziki, 2020, Volume 46, Issue 7, Pages 52–54
DOI: https://doi.org/10.21883/PJTF.2020.07.49222.18097 (Mi pjtf5149) 		 
Optical time-of-flight diagnostics of intense pulsed ion beams

V. A. Ryzhkov, B. A. Nechaev, V. N. Padalko

Research School of High-Energy Physics, Tomsk Polytechnic University
Full-text PDF (116 kB)
DOI: https://doi.org/10.21883/PJTF.2020.07.49222.18097
Abstract: Ablation of a thin surface contamination layer is used to control fluencies of intense pulsed ion beams. The layer is self-restored after each ion pulse. An optical time-of-flight spectrometer measures velocities of the lightest components of the ablation plasma, hydrogen and carbon, to determine the ion fluence.
Keywords: surface contamination, energy input, ablative plasma, hydrogen, carbon.
Funding agency Grant number
Russian Science Foundation 17-19-01442
This work was supported by the Russian Science Foundation, project no. 17-19-01442.
Received: 05.11.2019
Revised: 16.01.2020
Accepted: 20.01.2020
English version:
Technical Physics Letters, 2020, Volume 46, Issue 4, Pages 354–356
DOI: https://doi.org/10.1134/S1063785020040136
Bibliographic databases:
Document Type: Article
Language: Russian
Citation: V. A. Ryzhkov, B. A. Nechaev, V. N. Padalko, “Optical time-of-flight diagnostics of intense pulsed ion beams”, Pisma v Zhurnal Tekhnicheskoi Fiziki, 46:7 (2020), 52–54; Tech. Phys. Lett., 46:4 (2020), 354–356
Citation in format AMSBIB
\Bibitem{RyzNecPad20}
\by V.~A.~Ryzhkov, B.~A.~Nechaev, V.~N.~Padalko
\paper Optical time-of-flight diagnostics of intense pulsed ion beams
\jour Pisma v Zhurnal Tekhnicheskoi Fiziki
\yr 2020
\vol 46
\issue 7
\pages 52--54
\mathnet{http://mi.mathnet.ru/pjtf5149}
\crossref{https://doi.org/10.21883/PJTF.2020.07.49222.18097}
\elib{https://elibrary.ru/item.asp?id=43800774}
\transl
\jour Tech. Phys. Lett.
\yr 2020
\vol 46
\issue 4
\pages 354--356
\crossref{https://doi.org/10.1134/S1063785020040136}
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