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This article is cited in 1 scientific paper (total in 1 paper)
Spin accumulation in the Fe$_{3}$Si/$n$-Si epitaxial structure and related electric bias effect
A. S. Tarasovab, A. V. Lukyanenkoab, I. A. Bondarevab, I. A. Yakovleva, S. N. Varnakova, S. G. Ovchinnikovab, N. V. Volkovab a L. V. Kirensky Institute of Physics, Siberian Branch of the Russian Academy of Sciences, Krasnoyarsk
b Institute of Engineering Physics and Radioelectronics, Siberian Federal University, Krasnoyarsk
Abstract:
The electrical injection of a spin-polarized current into silicon was demonstrated in the Fe$_{3}$Si/$n$-Si epitaxial structure. The spin accumulation effect was studied by measuring local and nonlocal voltage signals in a specially prepared 4-terminal device. The detected effect of electrical bias on the spin signal is discussed and compared with other results reported for ferromagnet/semiconductor structures.
Keywords:
iron silicide, ferromagnet/semiconductor structure, Hanle effect, spin accumulation, electrical spin injection.
Received: 08.11.2019 Revised: 19.02.2020 Accepted: 06.04.2020
Citation:
A. S. Tarasov, A. V. Lukyanenko, I. A. Bondarev, I. A. Yakovlev, S. N. Varnakov, S. G. Ovchinnikov, N. V. Volkov, “Spin accumulation in the Fe$_{3}$Si/$n$-Si epitaxial structure and related electric bias effect”, Pisma v Zhurnal Tekhnicheskoi Fiziki, 46:13 (2020), 43–46; Tech. Phys. Lett., 46:7 (2020), 665–668
Linking options:
https://www.mathnet.ru/eng/pjtf5064 https://www.mathnet.ru/eng/pjtf/v46/i13/p43
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