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Pisma v Zhurnal Tekhnicheskoi Fiziki, 2020, Volume 46, Issue 14, Pages 47–50
DOI: https://doi.org/10.21883/PJTF.2020.14.49668.18298
(Mi pjtf5052)
 

Characteristic regularities in condensation of nickel layers on the surface of a tungsten single crystal

O. L. Golubev

Ioffe Institute, St. Petersburg
Abstract: Condensation and adsorption of Ni with a thickness from several tenths of a monoatomic layer to several hundred layers on the surface of a single-crystal W tip has been studied by field emission microscopy in a wide range of surface temperature $T$. In contrast to adsorption of Si on W, adsorption of Ni on W does not induce any W surface reconstruction in the entire range of substrate temperatures $T$. Phenomena of bulk diffusion and field reconstruction of the surface are not observed as well. At multilayer Ni coatings, Ni crystallites with peculiar structure and faceting grow on the W surface (on close-packed and loose W faces at small and large $T$ values, respectively). The presence of a strong external electric field makes it possible to retain crystallites on the W surface at temperatures much higher than their dissolution temperature in the absence of an external field.
Keywords: nickel, tungsten, condensation, work function.
Received: 20.03.2020
Revised: 20.04.2020
Accepted: 20.04.2020
English version:
Technical Physics Letters, 2020, Volume 46, Issue 7, Pages 721–724
DOI: https://doi.org/10.1134/S1063785020070172
Bibliographic databases:
Document Type: Article
Language: Russian
Citation: O. L. Golubev, “Characteristic regularities in condensation of nickel layers on the surface of a tungsten single crystal”, Pisma v Zhurnal Tekhnicheskoi Fiziki, 46:14 (2020), 47–50; Tech. Phys. Lett., 46:7 (2020), 721–724
Citation in format AMSBIB
\Bibitem{Gol20}
\by O.~L.~Golubev
\paper Characteristic regularities in condensation of nickel layers on the surface of a tungsten single crystal
\jour Pisma v Zhurnal Tekhnicheskoi Fiziki
\yr 2020
\vol 46
\issue 14
\pages 47--50
\mathnet{http://mi.mathnet.ru/pjtf5052}
\crossref{https://doi.org/10.21883/PJTF.2020.14.49668.18298}
\elib{https://elibrary.ru/item.asp?id=43870333}
\transl
\jour Tech. Phys. Lett.
\yr 2020
\vol 46
\issue 7
\pages 721--724
\crossref{https://doi.org/10.1134/S1063785020070172}
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