|
This article is cited in 5 scientific papers (total in 5 papers)
A selective BP/Si contact formed by low-temperature plasma-enhanced atomic layer deposition
A. S. Gudovskikhab, D. A. Kudriashova, A. I. Baranova, A. V. Uvarova, I. A. Morozova a Alferov Federal State Budgetary Institution of Higher Education and Science Saint Petersburg National Research Academic University of the Russian Academy of Sciences, St. Petersburg
b Saint Petersburg Electrotechnical University "LETI"
Abstract:
For the first time, the possibility of forming boron phosphide layers by plasma-enhanced atomic-layer deposition at a temperature of
250$^{\circ}$C has been shown. Also the possibility of their use as a selective hole contact to silicon for solar cell application has been experimentally demonstrated.
Keywords:
boron phosphide, silicon, selective contact, solar cell.
Received: 23.09.2020 Revised: 13.10.2020 Accepted: 13.10.2020
Citation:
A. S. Gudovskikh, D. A. Kudriashov, A. I. Baranov, A. V. Uvarov, I. A. Morozov, “A selective BP/Si contact formed by low-temperature plasma-enhanced atomic layer deposition”, Pisma v Zhurnal Tekhnicheskoi Fiziki, 47:2 (2021), 49–51; Tech. Phys. Lett., 47:1 (2021), 96–98
Linking options:
https://www.mathnet.ru/eng/pjtf4888 https://www.mathnet.ru/eng/pjtf/v47/i2/p49
|
Statistics & downloads: |
Abstract page: | 37 | Full-text PDF : | 9 |
|