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The role of Coulomb interaction in the defect model of a Schottky barrier
S. Yu. Davydova, O. V. Posrednikb a Ioffe Institute, St. Petersburg
b Saint Petersburg Electrotechnical University "LETI"
Abstract:
A model of a Schottky barrier is proposed in which dimers consisting of semiconductor defects and nearest metal atoms are present at the interface. Short-range Coulomb repulsion is included between defect electrons and metal atom electrons. Analytical expressions for the occupation numbers of atoms and defects and the Schottky barrier height are obtained.
Keywords:
interface semiconductor defect, interface metal atoms, Coulomb repulsion, occupation numbers.
Received: 23.10.2020 Revised: 21.11.2020 Accepted: 22.11.2020
Citation:
S. Yu. Davydov, O. V. Posrednik, “The role of Coulomb interaction in the defect model of a Schottky barrier”, Pisma v Zhurnal Tekhnicheskoi Fiziki, 47:5 (2021), 28–30; Tech. Phys. Lett., 47:3 (2021), 234–236
Linking options:
https://www.mathnet.ru/eng/pjtf4841 https://www.mathnet.ru/eng/pjtf/v47/i5/p28
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Abstract page: | 40 | Full-text PDF : | 15 |
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