|
This article is cited in 1 scientific paper (total in 1 paper)
High-voltage avalanche 4$H$-SiC diodes with a protective semi-insulating area
P. A. Ivanov, M. F. Kudoyarov, N. M. Lebedeva, N. D. Il'inskaya, T. P. Samsonova Ioffe Institute, St. Petersburg
Abstract:
High-voltage 4$H$-SiC diodes with controlled avalanche breakdown at a reverse voltage of 1460 V have been fabricated. To eliminate edge effects on the periphery of the diodes, a semi-insulating area was created by irradiation with high-energy (53 MeV) argon ions. The fabricated diodes operate at avalanche current densities of $\sim$10$^3$ A/cm$^2$, and the avalanche resistance is no more than 0.03 $\Omega$ $\cdot$ cm$^2$. At a current pulse duration of 4 $\mu$s, the avalanche energy dissipated by the diodes to failure (due to secondary thermal breakdown) and local thermal overheating are 5 J/cm$^2$ and 850$^\circ$C, respectively.
Keywords:
silicon carbide, diode, security circuit, avalanche breakdown.
Received: 26.11.2020 Revised: 26.11.2020 Accepted: 14.12.2020
Citation:
P. A. Ivanov, M. F. Kudoyarov, N. M. Lebedeva, N. D. Il'inskaya, T. P. Samsonova, “High-voltage avalanche 4$H$-SiC diodes with a protective semi-insulating area”, Pisma v Zhurnal Tekhnicheskoi Fiziki, 47:6 (2021), 48–50; Tech. Phys. Lett., 47:3 (2021), 275–277
Linking options:
https://www.mathnet.ru/eng/pjtf4833 https://www.mathnet.ru/eng/pjtf/v47/i6/p48
|
|