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Pisma v Zhurnal Tekhnicheskoi Fiziki, 2021, Volume 47, Issue 6, Pages 48–50
DOI: https://doi.org/10.21883/PJTF.2021.06.50760.18637
(Mi pjtf4833)
 

This article is cited in 1 scientific paper (total in 1 paper)

High-voltage avalanche 4$H$-SiC diodes with a protective semi-insulating area

P. A. Ivanov, M. F. Kudoyarov, N. M. Lebedeva, N. D. Il'inskaya, T. P. Samsonova

Ioffe Institute, St. Petersburg
Full-text PDF (233 kB) Citations (1)
Abstract: High-voltage 4$H$-SiC diodes with controlled avalanche breakdown at a reverse voltage of 1460 V have been fabricated. To eliminate edge effects on the periphery of the diodes, a semi-insulating area was created by irradiation with high-energy (53 MeV) argon ions. The fabricated diodes operate at avalanche current densities of $\sim$10$^3$ A/cm$^2$, and the avalanche resistance is no more than 0.03 $\Omega$ $\cdot$ cm$^2$. At a current pulse duration of 4 $\mu$s, the avalanche energy dissipated by the diodes to failure (due to secondary thermal breakdown) and local thermal overheating are 5 J/cm$^2$ and 850$^\circ$C, respectively.
Keywords: silicon carbide, diode, security circuit, avalanche breakdown.
Received: 26.11.2020
Revised: 26.11.2020
Accepted: 14.12.2020
English version:
Technical Physics Letters, 2021, Volume 47, Issue 3, Pages 275–277
DOI: https://doi.org/10.1134/S1063785021030202
Bibliographic databases:
Document Type: Article
Language: Russian
Citation: P. A. Ivanov, M. F. Kudoyarov, N. M. Lebedeva, N. D. Il'inskaya, T. P. Samsonova, “High-voltage avalanche 4$H$-SiC diodes with a protective semi-insulating area”, Pisma v Zhurnal Tekhnicheskoi Fiziki, 47:6 (2021), 48–50; Tech. Phys. Lett., 47:3 (2021), 275–277
Citation in format AMSBIB
\Bibitem{IvaKudLeb21}
\by P.~A.~Ivanov, M.~F.~Kudoyarov, N.~M.~Lebedeva, N.~D.~Il'inskaya, T.~P.~Samsonova
\paper High-voltage avalanche 4$H$-SiC diodes with a protective semi-insulating area
\jour Pisma v Zhurnal Tekhnicheskoi Fiziki
\yr 2021
\vol 47
\issue 6
\pages 48--50
\mathnet{http://mi.mathnet.ru/pjtf4833}
\crossref{https://doi.org/10.21883/PJTF.2021.06.50760.18637}
\elib{https://elibrary.ru/item.asp?id=46301753}
\transl
\jour Tech. Phys. Lett.
\yr 2021
\vol 47
\issue 3
\pages 275--277
\crossref{https://doi.org/10.1134/S1063785021030202}
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  • This publication is cited in the following 1 articles:
    Citing articles in Google Scholar: Russian citations, English citations
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