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The influence of metal masks on matching of the lower electrode and a high-frequency bias generator at reactive ion etching of large substrates
S. D. Poletayevab, A. I. Lyubimovc a Image Processing Systems Institute of the RAS - Branch of the FSRC "Crystallography and Photonics" RAS, Samara, Russia, Samara
b Samara National Research University
c State Institute of Applied Optics Federal Research and Production Centre, Kazan
Abstract:
The influence of metal masks on matching of the lower electrode and a high-frequency bias generator at selective reactive ion mask etching of large substrates in Freon-14 has been investigated both theoretically and experimentally. It is shown for masks with a coating of substrates of more than 30% that the reactive power component increases at distances from the center that are close to the substrate radius. It is established that the specific reactive power is independent of the thickness and type of metal masks. It is shown experimentally that masks with any substrate-coating coefficient of practical importance connected to the lower electrode via a substrate holder improve matching by decreasing the power reflectance.
Keywords:
diffractive microrelief, reactive ion etching, impedance, substrate holder, lower electrode.
Received: 25.01.2021 Revised: 12.03.2021 Accepted: 12.03.2021
Citation:
S. D. Poletayev, A. I. Lyubimov, “The influence of metal masks on matching of the lower electrode and a high-frequency bias generator at reactive ion etching of large substrates”, Pisma v Zhurnal Tekhnicheskoi Fiziki, 47:11 (2021), 44–47; Tech. Phys. Lett., 47:8 (2021), 569–572
Linking options:
https://www.mathnet.ru/eng/pjtf4777 https://www.mathnet.ru/eng/pjtf/v47/i11/p44
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Abstract page: | 47 | Full-text PDF : | 10 |
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