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This article is cited in 1 scientific paper (total in 1 paper)
An infrared radiation photoresistor based on silicon with nanoclusters of manganese atoms
M. K. Bakhadyrkhanov, Sh. N. Ibodullaev, N. F. Zikrillaev, S. V. Koveshnikov Tashkent State Technical University
Abstract:
The possibility of using silicon with the nanoclusters of manganese atoms for creating photoresistors in the spectral region
$\lambda$ = 1.2–3 $\mu$m is shown. It is found that such photodetectors possess a threshold sensitivity of about 10$^{-11}$ W at a wavelength of 1.55 $\mu$m. The quantum efficiency at a wavelength of 2 $\mu$m exceeds 10% and is 0.1% at a wavelength of 2.5 $\mu$m, which makes it possible to use the impurity photosensitivity of silicon with the nanoclusters of manganese atoms for creating high-resolution array photodetectors operating in the spectral region of up to 2.5 $\mu$m.
Keywords:
silicon, cluster of manganese, photosensitivity.
Received: 13.10.2020 Revised: 30.03.2021 Accepted: 01.04.2021
Citation:
M. K. Bakhadyrkhanov, Sh. N. Ibodullaev, N. F. Zikrillaev, S. V. Koveshnikov, “An infrared radiation photoresistor based on silicon with nanoclusters of manganese atoms”, Pisma v Zhurnal Tekhnicheskoi Fiziki, 47:13 (2021), 12–15; Tech. Phys. Lett., 47:9 (2021), 641–644
Linking options:
https://www.mathnet.ru/eng/pjtf4742 https://www.mathnet.ru/eng/pjtf/v47/i13/p12
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