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Pisma v Zhurnal Tekhnicheskoi Fiziki, 2021, Volume 47, Issue 15, Pages 23–26
DOI: https://doi.org/10.21883/PJTF.2021.15.51229.18784 (Mi pjtf4719) 		 
Demonstration of resistive switching effect in separate filaments in Ag/Ge/Si memristor structures by conductive atomic force microscopy

V. A. Vorontsov, D. A. Antonov, A. V. Kruglov, I. N. Antonov, V. E. Kotomina, V. G. Shengurov, S. A. Denisov, V. Yu. Chalkov, D. O. Filatov, O. N. Gorshkov

National Research Lobachevsky State University of Nizhny Novgorod
Full-text PDF (589 kB)
DOI: https://doi.org/10.21883/PJTF.2021.15.51229.18784
Abstract: Resistive switching effect of separate dislocations in Ag/Ge/Si(001) memristor structures was demonstrated experimentally by Conductive Atomic Force Microscopy. Hysteresis loops typical for bipolar resistive switching were observed in the current-voltage curves of the dislocations due to formation and rapture of Ag filament in the Ge layer as a result of Ag$^+$ ion drift along the dislocation core.
Keywords: resistive switching, memristor, Ge/Si heterostructures, dislocations, ion sputtering, conductive atomic force microscopy.
Funding agency Grant number
Russian Science Foundation 18-72-10061
Russian Foundation for Basic Research 19-29-03026
Received: 24.03.2021
Revised: 27.04.2021
Accepted: 30.04.2021
Bibliographic databases:
Document Type: Article
Language: Russian
Citation: V. A. Vorontsov, D. A. Antonov, A. V. Kruglov, I. N. Antonov, V. E. Kotomina, V. G. Shengurov, S. A. Denisov, V. Yu. Chalkov, D. O. Filatov, O. N. Gorshkov, “Demonstration of resistive switching effect in separate filaments in Ag/Ge/Si memristor structures by conductive atomic force microscopy”, Pisma v Zhurnal Tekhnicheskoi Fiziki, 47:15 (2021), 23–26
Citation in format AMSBIB
\Bibitem{VorAntKru21}
\by V.~A.~Vorontsov, D.~A.~Antonov, A.~V.~Kruglov, I.~N.~Antonov, V.~E.~Kotomina, V.~G.~Shengurov, S.~A.~Denisov, V.~Yu.~Chalkov, D.~O.~Filatov, O.~N.~Gorshkov
\paper Demonstration of resistive switching effect in separate filaments in Ag/Ge/Si memristor structures by conductive atomic force microscopy
\jour Pisma v Zhurnal Tekhnicheskoi Fiziki
\yr 2021
\vol 47
\issue 15
\pages 23--26
\mathnet{http://mi.mathnet.ru/pjtf4719}
\crossref{https://doi.org/10.21883/PJTF.2021.15.51229.18784}
\elib{https://elibrary.ru/item.asp?id=46333493}
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