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Pisma v Zhurnal Tekhnicheskoi Fiziki, 1989, Volume 15, Issue 17, Pages 30–33 (Mi pjtf2852)  
ELECTRONIC ANALOGS OF THE TECHNIQUE OF BACK SCATTERING OF FAST IONS FOR INVESTIGATION OF DEFECT DEPTH PROFILES IN MONOCRYSTALS

V. V. Makarov, V. P. Artemev, N. N. Petrov
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Document Type: Article
Language: Russian
Citation: V. V. Makarov, V. P. Artemev, N. N. Petrov, “ELECTRONIC ANALOGS OF THE TECHNIQUE OF BACK SCATTERING OF FAST IONS FOR INVESTIGATION OF DEFECT DEPTH PROFILES IN MONOCRYSTALS”, Pisma v Zhurnal Tekhnicheskoi Fiziki, 15:17 (1989), 30–33
Citation in format AMSBIB
\Bibitem{Mak89}
\by V.~V.~Makarov, V.~P.~Artemev, N.~N.~Petrov
\paper ELECTRONIC ANALOGS OF THE TECHNIQUE OF BACK SCATTERING OF FAST IONS FOR
INVESTIGATION OF DEFECT DEPTH PROFILES IN MONOCRYSTALS
\jour Pisma v Zhurnal Tekhnicheskoi Fiziki
\yr 1989
\vol 15
\issue 17
\pages 30--33
\mathnet{http://mi.mathnet.ru/pjtf2852}
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