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Fizika i Tekhnika Poluprovodnikov, 2020, Volume 54, Issue 12, Page 1320 (Mi phts6680)  

Surface, interfaces, thin films

Influence of annealing temperature variations on the properties of chemically deposited nanocrystalline zinc-selenide thin films

T. A. H. Mir, R. A. G. Shaikh, D. S. Patil, B. K. Sonawane

Department of Electronics, School of Physical Sciences, Kavayitri Bahinabai Chaudhari North Maharashtra University, Jalgaon, Maharashtra, 425001 India
Abstract: In the present report, influence of annealing temperature variations on the optical, morphological, and structural properties of chemically deposited nanocrystalline zinc-selenide thin films is studied employing an $X$-ray diffractometer, scanning electron microscope, and UV spectroscope. As-synthesized and annealed films exhibit nanocrystalline nature with cubic structure. The result shows that ZnSe thin films contain spherical particles that are composed of nanocrystals ranging from 3 to 7 nm crystallite size. The SEM studies reveal that the inter- crystalline spaces have been found to be reduced with an increase in grain size as annealing temperature increases. The EDS data reveal that the obtained thin films are rich in selenium. However, thermal annealing assisted to reduce the non-stoichiometric nature of the films by reducing selenium content that was found to be reduced with a rise in annealing temperature. The reduction in strains and dislocation density was observed after the annealing process. The band-gap energy was found to be raised from 2.56 to 2.76 eV with a rise in annealing temperature. The transmittance of more than 80% was recorded by as-synthesized and annealed films as well.
Keywords: chemical bath deposition, annealed ZnSe films, optical properties.
Funding agency Grant number
Vice-Chancellor Research Motivational Scheme (VCRMS) NMU/11A/VCRMS/2016-17/Science1/85
This research work is supported by the VCRMS (Vice-Chancellor Research Motivational Scheme), Kavayatri Bahinabai Chaudhari North Maharashtra University (NMU/11A/VCRMS/2016-17/Science1/85).
Received: 17.07.2020
Revised: 17.07.2020
Accepted: 13.08.2020
English version:
Semiconductors, 2020, Volume 54, Issue 12, Pages 1577–1582
DOI: https://doi.org/10.1134/S1063782620120234
Document Type: Article
Language: English
Citation: T. A. H. Mir, R. A. G. Shaikh, D. S. Patil, B. K. Sonawane, “Influence of annealing temperature variations on the properties of chemically deposited nanocrystalline zinc-selenide thin films”, Fizika i Tekhnika Poluprovodnikov, 54:12 (2020), 1320; Semiconductors, 54:12 (2020), 1577–1582
Citation in format AMSBIB
\Bibitem{MirShaPat20}
\by T.~A.~H.~Mir, R.~A.~G.~Shaikh, D.~S.~Patil, B.~K.~Sonawane
\paper Influence of annealing temperature variations on the properties of chemically deposited nanocrystalline zinc-selenide thin films
\jour Fizika i Tekhnika Poluprovodnikov
\yr 2020
\vol 54
\issue 12
\pages 1320
\mathnet{http://mi.mathnet.ru/phts6680}
\transl
\jour Semiconductors
\yr 2020
\vol 54
\issue 12
\pages 1577--1582
\crossref{https://doi.org/10.1134/S1063782620120234}
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