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Fizika i Tekhnika Poluprovodnikov, 2020, Volume 54, Issue 11, Page 1217 (Mi phts6669)  

This article is cited in 4 scientific papers (total in 4 papers)

Surface, interfaces, thin films

Optical parameters of both As$_2$S$_3$ and As$_2$S$_3$ thin films from ultraviolet to the near-infrared via variable-angle spectroscopic ellipsometer

F. Abdel-Wahaba, I. M. Ashrafab, F. B. Ahmeda

a Department of Physics, Faculty of Science, Aswan University, Aswan, Egypt
b Advanced Functional Materials & Optoelectronics Laboratory (AFMOL), Department of Physics, College of Science, King Khalid University, Abha 61413, Saudi Arabia
Full-text PDF (32 kB) Citations (4)
Abstract: In the UV-visible–near infrared regions from 245 to 1000 nm, variable-angle spectroscopic ellipsometer (VASE) was used to investigate optical functions of As$_2$S$_3$ and As$_2$S$_3$ thin films. In the entire measured spectral range, data were analyzed by assembly from several dispersion models. These assemblies comprise individual Tauc–Lorentz supplemented by several Lorentz (TL-group) or single Cody–Lorentz with several Lorentz (CL-group) models. For As$_2$S$_3$ and As$_2$S$_3$ thin films, the optical parameters were quantified. The model parameters, such as the Lorentz amplitude, resonance frequency, oscillator width, extinction coefficients, refractive indices, and Urbach and optical band energy of both films were obtained. The band gap energy $E_g$ was experimentally determined using the obtained data of CL-group from $(\alpha hv)^{1/2}$ vs $hv$ plots. It is found that the band gap energies of As$_2$S$_3$ and As$_2$S$_3$ were 1.796 and 2.349 eV, respectively. The $E_g$ values for the films were theoretically investigated by the bond statistics of the random covalent network model (CRNM) with the aid of Manca’s relation. Plausible agreement between the experimental and calculated $E_g$ values for both samples was obtained.
Keywords: chalcogenide thin films, variable-angle spectroscopic ellipsometer, Tauc–Lorentz model, Cody–Lorentz model.
Received: 25.05.2020
Revised: 22.06.2020
Accepted: 01.07.2020
English version:
Semiconductors, 2020, Volume 54, Issue 11, Pages 1430–1438
DOI: https://doi.org/10.1134/S1063782620110020
Document Type: Article
Language: English
Citation: F. Abdel-Wahab, I. M. Ashraf, F. B. Ahmed, “Optical parameters of both As$_2$S$_3$ and As$_2$S$_3$ thin films from ultraviolet to the near-infrared via variable-angle spectroscopic ellipsometer”, Fizika i Tekhnika Poluprovodnikov, 54:11 (2020), 1217; Semiconductors, 54:11 (2020), 1430–1438
Citation in format AMSBIB
\Bibitem{AbdAshAhm20}
\by F.~Abdel-Wahab, I.~M.~Ashraf, F.~B.~Ahmed
\paper Optical parameters of both As$_2$S$_3$ and As$_2$S$_3$ thin films from ultraviolet to the near-infrared via variable-angle spectroscopic ellipsometer
\jour Fizika i Tekhnika Poluprovodnikov
\yr 2020
\vol 54
\issue 11
\pages 1217
\mathnet{http://mi.mathnet.ru/phts6669}
\transl
\jour Semiconductors
\yr 2020
\vol 54
\issue 11
\pages 1430--1438
\crossref{https://doi.org/10.1134/S1063782620110020}
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  • https://www.mathnet.ru/eng/phts/v54/i11/p1217
  • This publication is cited in the following 4 articles:
    Citing articles in Google Scholar: Russian citations, English citations
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    Fizika i Tekhnika Poluprovodnikov Fizika i Tekhnika Poluprovodnikov
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