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Fizika i Tekhnika Poluprovodnikov, 2016, Volume 50, Issue 3, Pages 415–419
(Mi phts6525)
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Manufacturing, processing, testing of materials and structures
Effect of the Ti-nanolayer thickness on the self-lift-off of thick GaN epitaxial layers
A. A. Yugova, S. S. Malakhova, A. A. Donskova, M. P. Duhnovskiib, S. N. Knyazeva, Yu. P. Kozlovac, T. G. Yugovaa, I. A. Belogorohova a JSC "Giredmet" SRC RF, the Federal State Research and Design Institute of Rare Metal Industry, Moscow, Russia
b Research and Production Corporation "Istok" named after Shokin, Fryazino, Moskovskaya obl.
c Institute for Nuclear Research, Russian Academy of Sciences, Moscow
Abstract:
The effect of the type of substrate, sapphire substrate (c- and r-orientation) or GaN/Al$_2$O$_3$ template (c- and r-orientations), on the nitridation of an amorphous titanium nanolayer is shown. The effect of the titanium-nanolayer thickness on thick GaN epitaxial layer self-separation from the substrate is revealed. The titanium-nanolayer thickness at which thick GaN layer is reproducibly self-separated is within 20–40 nm.
Keywords:
Sapphire Substrate, Diffraction Reflection Curve, Template Substrate.
Received: 23.06.2015 Accepted: 30.06.2015
Citation:
A. A. Yugov, S. S. Malakhov, A. A. Donskov, M. P. Duhnovskii, S. N. Knyazev, Yu. P. Kozlova, T. G. Yugova, I. A. Belogorohov, “Effect of the Ti-nanolayer thickness on the self-lift-off of thick GaN epitaxial layers”, Fizika i Tekhnika Poluprovodnikov, 50:3 (2016), 415–419; Semiconductors, 50:3 (2016), 411–414
Linking options:
https://www.mathnet.ru/eng/phts6525 https://www.mathnet.ru/eng/phts/v50/i3/p415
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Abstract page: | 28 | Full-text PDF : | 15 |
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