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Fizika i Tekhnika Poluprovodnikov, 2016, Volume 50, Issue 3, Pages 415–419 (Mi phts6525)  

Manufacturing, processing, testing of materials and structures

Effect of the Ti-nanolayer thickness on the self-lift-off of thick GaN epitaxial layers

A. A. Yugova, S. S. Malakhova, A. A. Donskova, M. P. Duhnovskiib, S. N. Knyazeva, Yu. P. Kozlovac, T. G. Yugovaa, I. A. Belogorohova

a JSC "Giredmet" SRC RF, the Federal State Research and Design Institute of Rare Metal Industry, Moscow, Russia
b Research and Production Corporation "Istok" named after Shokin, Fryazino, Moskovskaya obl.
c Institute for Nuclear Research, Russian Academy of Sciences, Moscow
Abstract: The effect of the type of substrate, sapphire substrate (c- and r-orientation) or GaN/Al$_2$O$_3$ template (c- and r-orientations), on the nitridation of an amorphous titanium nanolayer is shown. The effect of the titanium-nanolayer thickness on thick GaN epitaxial layer self-separation from the substrate is revealed. The titanium-nanolayer thickness at which thick GaN layer is reproducibly self-separated is within 20–40 nm.
Keywords: Sapphire Substrate, Diffraction Reflection Curve, Template Substrate.
Received: 23.06.2015
Accepted: 30.06.2015
English version:
Semiconductors, 2016, Volume 50, Issue 3, Pages 411–414
DOI: https://doi.org/10.1134/S1063782616030246
Bibliographic databases:
Document Type: Article
Language: Russian
Citation: A. A. Yugov, S. S. Malakhov, A. A. Donskov, M. P. Duhnovskii, S. N. Knyazev, Yu. P. Kozlova, T. G. Yugova, I. A. Belogorohov, “Effect of the Ti-nanolayer thickness on the self-lift-off of thick GaN epitaxial layers”, Fizika i Tekhnika Poluprovodnikov, 50:3 (2016), 415–419; Semiconductors, 50:3 (2016), 411–414
Citation in format AMSBIB
\Bibitem{YugMalDon16}
\by A.~A.~Yugov, S.~S.~Malakhov, A.~A.~Donskov, M.~P.~Duhnovskii, S.~N.~Knyazev, Yu.~P.~Kozlova, T.~G.~Yugova, I.~A.~Belogorohov
\paper Effect of the Ti-nanolayer thickness on the self-lift-off of thick GaN epitaxial layers
\jour Fizika i Tekhnika Poluprovodnikov
\yr 2016
\vol 50
\issue 3
\pages 415--419
\mathnet{http://mi.mathnet.ru/phts6525}
\elib{https://elibrary.ru/item.asp?id=25668215}
\transl
\jour Semiconductors
\yr 2016
\vol 50
\issue 3
\pages 411--414
\crossref{https://doi.org/10.1134/S1063782616030246}
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