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Fizika i Tekhnika Poluprovodnikov, 2016, Volume 50, Issue 3, Pages 354–356 (Mi phts6516)  

This article is cited in 4 scientific papers (total in 4 papers)

Semiconductor structures, low-dimensional systems, quantum phenomena

Two stages of surface-defect formation in a MOS structure under low-dose rate $\gamma$ irradiation

V. D. Popov

National Engineering Physics Institute "MEPhI", Moscow
Full-text PDF (155 kB) Citations (4)
Abstract: The results of an experimental study of how surface defects are formed at the Si–SiO$_2$ interface at $\gamma$-radiation dose rates of $P$ = 0.1 and 1.0 rad/s are reported. It is found that the surface defects are formed in two stages. The defect-formation mechanisms are analyzed.
Keywords: Dose Rate, Surface Defect, Exponential Dependence, Gate Oxide, Threshold Time.
Received: 11.06.2015
Accepted: 17.06.2015
English version:
Semiconductors, 2016, Volume 50, Issue 3, Pages 349–351
DOI: https://doi.org/10.1134/S1063782616030209
Bibliographic databases:
Document Type: Article
Language: Russian
Citation: V. D. Popov, “Two stages of surface-defect formation in a MOS structure under low-dose rate $\gamma$ irradiation”, Fizika i Tekhnika Poluprovodnikov, 50:3 (2016), 354–356; Semiconductors, 50:3 (2016), 349–351
Citation in format AMSBIB
\Bibitem{Pop16}
\by V.~D.~Popov
\paper Two stages of surface-defect formation in a MOS structure under low-dose rate $\gamma$ irradiation
\jour Fizika i Tekhnika Poluprovodnikov
\yr 2016
\vol 50
\issue 3
\pages 354--356
\mathnet{http://mi.mathnet.ru/phts6516}
\elib{https://elibrary.ru/item.asp?id=25668179}
\transl
\jour Semiconductors
\yr 2016
\vol 50
\issue 3
\pages 349--351
\crossref{https://doi.org/10.1134/S1063782616030209}
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  • https://www.mathnet.ru/eng/phts/v50/i3/p354
  • This publication is cited in the following 4 articles:
    Citing articles in Google Scholar: Russian citations, English citations
    Related articles in Google Scholar: Russian articles, English articles
    Fizika i Tekhnika Poluprovodnikov Fizika i Tekhnika Poluprovodnikov
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