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Fizika i Tekhnika Poluprovodnikov, 2016, Volume 50, Issue 4, Pages 470–473
(Mi phts6488)
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Semiconductor structures, low-dimensional systems, quantum phenomena
Impact ionization in nonuniformly heated silicon $p^{+}$–$n$–$n^{+}$- and $n^{+}$–$p$–$p^{+}$ structures
A. M. Musaev Daghestan Institute of Physics after Amirkhanov, Makhachkala, Russia
Abstract:
Experimental results on the effects of changes in the impact-ionization current in silicon diffusion $p^{+}$–$n$–$n^{+}$- and $n^{+}$–$p$–$p^{+}$ structures upon nonuniform heating are presented. It is shown that the revealed effects are associated with the transformation of band energy levels caused by thermoelastic stresses of the structures.
Keywords:
Thermoelastic Stress, Nonuniform Heating, Ionization Coefficient, Avalanche Breakdown, Phosphorus Diffusion.
Received: 06.04.2015 Accepted: 21.09.2015
Citation:
A. M. Musaev, “Impact ionization in nonuniformly heated silicon $p^{+}$–$n$–$n^{+}$- and $n^{+}$–$p$–$p^{+}$ structures”, Fizika i Tekhnika Poluprovodnikov, 50:4 (2016), 470–473; Semiconductors, 50:4 (2016), 462–465
Linking options:
https://www.mathnet.ru/eng/phts6488 https://www.mathnet.ru/eng/phts/v50/i4/p470
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Abstract page: | 26 | Full-text PDF : | 11 |
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