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Fizika i Tekhnika Poluprovodnikov, 2016, Volume 50, Issue 5, Pages 668–673
(Mi phts6470)
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This article is cited in 1 scientific paper (total in 1 paper)
Semiconductor physics
Isothermal current–voltage characteristics of high-voltage 4$H$-SiC junction barrier Schottky rectifiers
M. E. Levinshteĭna, P. A. Ivanova, Q. J. Zhangb, J. W. Palmourb a Ioffe Institute, St. Petersburg
b Cree Inc., USA
Abstract:
The forward-pulse isothermal current–voltage characteristics of 4$H$-SiC junction barrier Schottky rectifiers (JBSs) with a nominal blocking voltage of 1700 V are measured in the temperature range from -80 to +90$^\circ$C (193–363 K) up to current densities $j$ of $\sim$5600 A/cm$^2$ at -80$^\circ$C and 3000 A/cm$^2$ at +90$^\circ$C. In these measurements, the overheating of the structures relative to the ambient temperature, $\Delta T$, did not exceed several degrees. At higher current densities, the effective injection of minority carriers (holes) into the base of the structures is observed, which is accompanied by the appearance of an $S$-type differential resistance. The pulsed isothermal current–voltage characteristics are also measured at a temperature of 77 K.
Keywords:
Versus Characteristic, Schottky Barrier, Transient Process, Minority Carrier, Voltage Characteristic.
Received: 20.10.2015 Accepted: 26.10.2015
Citation:
M. E. Levinshteǐn, P. A. Ivanov, Q. J. Zhang, J. W. Palmour, “Isothermal current–voltage characteristics of high-voltage 4$H$-SiC junction barrier Schottky rectifiers”, Fizika i Tekhnika Poluprovodnikov, 50:5 (2016), 668–673; Semiconductors, 50:5 (2016), 656–661
Linking options:
https://www.mathnet.ru/eng/phts6470 https://www.mathnet.ru/eng/phts/v50/i5/p668
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