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Fizika i Tekhnika Poluprovodnikov, 2016, Volume 50, Issue 6, Pages 839–842
(Mi phts6449)
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Semiconductor physics
Method for increasing the carrier mobility in the channel of the 4$H$-SiC MOSFET
A. I. Mikhaylova, A. V. Afanasyeva, V. A. Ilyina, V. V. Luchinina, S. A. Reshanovb, A. Schönerb a Saint Petersburg Electrotechnical University "LETI"
b Ascatron AB, Kista, Sweden
Abstract:
A new method is suggested for increasing the carrier mobility in the channel of a field-effect transistor based on silicon carbide of the 4$H$ polytype via the oxidation of a bilayer system constituted by a thin layer of silicon nitride and a silicon-dioxide layer. Together with increasing carrier mobility, the average breakdown field strength decreases as compared with the gate insulator thermally grown in an atmosphere of N$_2$O.
Received: 03.12.2015 Accepted: 08.12.2015
Citation:
A. I. Mikhaylov, A. V. Afanasyev, V. A. Ilyin, V. V. Luchinin, S. A. Reshanov, A. Schöner, “Method for increasing the carrier mobility in the channel of the 4$H$-SiC MOSFET”, Fizika i Tekhnika Poluprovodnikov, 50:6 (2016), 839–842; Semiconductors, 50:6 (2016), 824–827
Linking options:
https://www.mathnet.ru/eng/phts6449 https://www.mathnet.ru/eng/phts/v50/i6/p839
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Statistics & downloads: |
Abstract page: | 32 | Full-text PDF : | 39 |
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