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Semiconductor physics
Analysis of the impact of non-1D effects on the gate switch-on current in 4$H$-SiC thyristors
S. N. Yurkova, T. T. Ìnatsakanova, M. E. Levinshteĭnb, A. G. Tandoeva, J. W. Palmourc a Russian Electrotechnical Institute Named after V. I. Lenin
b Ioffe Institute, St. Petersburg
c Wolfspeed, USA
Abstract:
The impact of non-1D effects caused by the spread of the gate current in the base layer on the gate switch-on current in 4$H$-SiC thyristors is considered. It is shown that a new switching mechanism implemented in 4$H$-SiC thyristors results in the dependence of the gate switch-on current on the thyristor parameters, with this dependence being fundamentally different from that in conventional silicon thyristors.
Received: 24.05.2016 Accepted: 14.06.2016
Citation:
S. N. Yurkov, T. T. Ìnatsakanov, M. E. Levinshteǐn, A. G. Tandoev, J. W. Palmour, “Analysis of the impact of non-1D effects on the gate switch-on current in 4$H$-SiC thyristors”, Fizika i Tekhnika Poluprovodnikov, 51:2 (2017), 234–239; Semiconductors, 51:2 (2017), 225–231
Linking options:
https://www.mathnet.ru/eng/phts6239 https://www.mathnet.ru/eng/phts/v51/i2/p234
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Abstract page: | 37 | Full-text PDF : | 11 |
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