Fizika i Tekhnika Poluprovodnikov
RUS  ENG    JOURNALS   PEOPLE   ORGANISATIONS   CONFERENCES   SEMINARS   VIDEO LIBRARY   PACKAGE AMSBIB  
General information
Latest issue
Archive

Search papers
Search references

RSS
Latest issue
Current issues
Archive issues
What is RSS



Fizika i Tekhnika Poluprovodnikov:
Year:
Volume:
Issue:
Page:
Find






Personal entry:
Login:
Password:
Save password
Enter
Forgotten password?
Register


Fizika i Tekhnika Poluprovodnikov, 2017, Volume 51, Issue 2, Pages 177–181
DOI: https://doi.org/10.21883/FTP.2017.02.44100.8310
(Mi phts6228)
 

This article is cited in 1 scientific paper (total in 1 paper)

Spectroscopy, interaction with radiation

Raman scattering in InP doped by Be$^+$-ion implantation

L. P. Avakyants, P. Yu. Bokov, A. V. Chervyakov

Faculty of Physics, Lomonosov Moscow State University
Full-text PDF (281 kB) Citations (1)
Abstract: InP (100) crystals implanted with Be$^+$ ions with an energy of 100 keV and doses of 10$^{13}$–10$^{15}$ cm$^{-2}$ are studied by Raman spectroscopy before and after thermal annealing at temperatures of 300–850$^\circ$C. It is found that, as the implanted ion dose is increased, the surface region of InP is partially amorphized; in this case, spectral lines related to longitudinal lattice vibrations exhibit a shift to lower frequencies and inhomogeneous broadening, which is indicative of the formation of a nanocrystalline phase. Thermal annealing results in recovery of the crystal structure of InP. At annealing temperatures of $>$ 700$^\circ$C, scattering at phonon–plasmon coupled modes is detected in the Raman spectra. This is attributed to electrical activation of the impurity. From the frequency of the phonon–plasmon mode, the concentration of heavy holes is estimated in the context of the model of a two-oscillator dielectric function.
Received: 28.04.2016
Accepted: 12.05.2016
English version:
Semiconductors, 2017, Volume 51, Issue 2, Pages 168–172
DOI: https://doi.org/10.1134/S106378261702004X
Bibliographic databases:
Document Type: Article
Language: Russian
Citation: L. P. Avakyants, P. Yu. Bokov, A. V. Chervyakov, “Raman scattering in InP doped by Be$^+$-ion implantation”, Fizika i Tekhnika Poluprovodnikov, 51:2 (2017), 177–181; Semiconductors, 51:2 (2017), 168–172
Citation in format AMSBIB
\Bibitem{AvaBokChe17}
\by L.~P.~Avakyants, P.~Yu.~Bokov, A.~V.~Chervyakov
\paper Raman scattering in InP doped by Be$^+$-ion implantation
\jour Fizika i Tekhnika Poluprovodnikov
\yr 2017
\vol 51
\issue 2
\pages 177--181
\mathnet{http://mi.mathnet.ru/phts6228}
\crossref{https://doi.org/10.21883/FTP.2017.02.44100.8310}
\elib{https://elibrary.ru/item.asp?id=29005990}
\transl
\jour Semiconductors
\yr 2017
\vol 51
\issue 2
\pages 168--172
\crossref{https://doi.org/10.1134/S106378261702004X}
Linking options:
  • https://www.mathnet.ru/eng/phts6228
  • https://www.mathnet.ru/eng/phts/v51/i2/p177
  • This publication is cited in the following 1 articles:
    Citing articles in Google Scholar: Russian citations, English citations
    Related articles in Google Scholar: Russian articles, English articles
    Fizika i Tekhnika Poluprovodnikov Fizika i Tekhnika Poluprovodnikov
    Statistics & downloads:
    Abstract page:29
    Full-text PDF :15
     
      Contact us:
     Terms of Use  Registration to the website  Logotypes © Steklov Mathematical Institute RAS, 2024