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This article is cited in 6 scientific papers (total in 6 papers)
Semiconductor physics
Current–voltage characteristics of high-voltage 4$H$-SiC $p^{+}$–$n_{0}$–$n^{+}$ diodes in the avalanche breakdown mode
P. A. Ivanov, A. S. Potapov, T. P. Samsonova, I. V. Grekhov Ioffe Institute, St. Petersburg
Abstract:
$p^{+}$–$n_{0}$–$n^{+}$ 4$H$-SiC diodes with homogeneous avalanche breakdown at 1860 V are fabricated. The pulse current–voltage characteristics are measured in the avalanche-breakdown mode up to a current density of 4000 A/cm$^2$. It is shown that the avalanche-breakdown voltage increases with increasing temperature. The following diode parameters are determined: the avalanche resistance (8.6 $\times$ 10$^{-2}$ $\Omega$ cm$^2$), the electron drift velocity in the $n_0$ base at electric fields higher than 10$^6$ V/cm (7.8 $\times$ 10$^6$ cm/s), and the relative temperature coefficient of the breakdown voltage (2.1 $\times$ 10$^{-4}$ K$^{-1}$).
Received: 09.08.2016 Accepted: 17.08.2016
Citation:
P. A. Ivanov, A. S. Potapov, T. P. Samsonova, I. V. Grekhov, “Current–voltage characteristics of high-voltage 4$H$-SiC $p^{+}$–$n_{0}$–$n^{+}$ diodes in the avalanche breakdown mode”, Fizika i Tekhnika Poluprovodnikov, 51:3 (2017), 390–394; Semiconductors, 51:3 (2017), 374–378
Linking options:
https://www.mathnet.ru/eng/phts6216 https://www.mathnet.ru/eng/phts/v51/i3/p390
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