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This article is cited in 2 scientific papers (total in 2 papers)
Manufacturing, processing, testing of materials and structures
Structural features of Sm$_{1-x}$Eu$_{x}$S thin polycrystalline films
V. V. Kaminskiia, S. M. Solov'eva, G. D. Khavrova, N. V. Sharenkovaa, Shinji Hiraib a Ioffe Institute, Russian Academy of Sciences, St. Petersburg, Russia
b Muroran Institute of Technology, Muroran, Hokkaido, Japan
Abstract:
Thin polycrystalline Sm$_{1-x}$Eu$_{x}$S films ($x$ = 0.1, 0.167, 0.2, 0.25, 0.33, 0.5) were prepared by evaporation of SmS and EuS powders. Structural features of the films were investigated. The influence of Eu concentration and temperature of film deposition on the value of lattice parameter and sizes of x-ray coherent scattering regions was studied. It is shown that formation of Sm$_{1-x}$Eu$_{x}$S films comes about according to the theory that was previously suggested for SmS films and that the deviation of lattice parameter is explained by the variable valence of samarium ions.
Received: 21.09.2016 Accepted: 28.09.2016
Citation:
V. V. Kaminskii, S. M. Solov'ev, G. D. Khavrov, N. V. Sharenkova, Shinji Hirai, “Structural features of Sm$_{1-x}$Eu$_{x}$S thin polycrystalline films”, Fizika i Tekhnika Poluprovodnikov, 51:6 (2017), 860; Semiconductors, 51:6 (2017), 828–830
Linking options:
https://www.mathnet.ru/eng/phts6147 https://www.mathnet.ru/eng/phts/v51/i6/p860
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