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This article is cited in 4 scientific papers (total in 4 papers)
Electronic properties of semiconductors
Simulation of drift-diffusion transport of charge carriers in semiconductor layers with a fractal structure in an alternating electric field
S.Sh. Rekhviashvili, A. A. Alikhanov Institute of Applied Mathematics and Automation, Russian Academy of Science, Nalchik, Russia
Abstract:
Based on the fractional-order partial differential equation, the diffusion-drift charge-carrier transport in a semiconductor layer with a fractal structure under a longitudinal alternating electric field is simulated. The simulation showed that the space–time distributions of carriers are broadened and asymmetric in layers with a fractal structure. Under certain conditions, the effect of charge oscillation frequency doubling in an external alternating electric field is observed.
Received: 22.11.2016 Accepted: 23.11.2016
Citation:
S.Sh. Rekhviashvili, A. A. Alikhanov, “Simulation of drift-diffusion transport of charge carriers in semiconductor layers with a fractal structure in an alternating electric field”, Fizika i Tekhnika Poluprovodnikov, 51:6 (2017), 787–791; Semiconductors, 51:6 (2017), 755–759
Linking options:
https://www.mathnet.ru/eng/phts6136 https://www.mathnet.ru/eng/phts/v51/i6/p787
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Abstract page: | 52 | Full-text PDF : | 19 |
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