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This article is cited in 2 scientific papers (total in 2 papers)
XV International Conference ''Thermoelectrics and Their Applications-2016 St. Petersburg'', November 15-16, 2016
On the morphology of the interlayer surface and micro-Raman spectra of layered films in topological insulators based on bismuth telluride
L. N. Luk'yanovaa, A. Yu. Bibikb, V. A. Aseevb, O. A. Usova, I. V. Makarenkoa, V. N. Petrova, N. V. Nikonorovb a Ioffe Institute, St. Petersburg
b St. Petersburg National Research University of Information Technologies, Mechanics and Optics
Abstract:
Resonant micro-Raman spectra and the morphology of the interlayer Van der Waals surface are studied for layered thin films of $n$-Bi$_{2}$Te$_{3}$ and solid solutions based on Bi$_{2}$Te$_{3}$. It is found that the composition, thickness, surface morphology, and the method of obtaining films affect the relative intensity of Raman phonons, which are sensitive to the topological surface states of Dirac fermions.
Received: 12.12.2016 Accepted: 19.12.2016
Citation:
L. N. Luk'yanova, A. Yu. Bibik, V. A. Aseev, O. A. Usov, I. V. Makarenko, V. N. Petrov, N. V. Nikonorov, “On the morphology of the interlayer surface and micro-Raman spectra of layered films in topological insulators based on bismuth telluride”, Fizika i Tekhnika Poluprovodnikov, 51:6 (2017), 763–765; Semiconductors, 51:6 (2017), 729–731
Linking options:
https://www.mathnet.ru/eng/phts6131 https://www.mathnet.ru/eng/phts/v51/i6/p763
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Abstract page: | 58 | Full-text PDF : | 10 |
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