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Fizika i Tekhnika Poluprovodnikov, 2017, Volume 51, Issue 8, Pages 1021–1022
DOI: https://doi.org/10.21883/FTP.2017.08.44777.46 (Mi phts6057) 		 
XV International Conference ''Thermoelectrics and Their Applications-2016 St. Petersburg'', November 15-16, 2016

Determination of the thermoelectric efficiency of thermoelectric materials from measurements of linear series of branches for $n$- and $p$-types of conductivity

Yu. P. Lebedev, A. S. Ivanov, A. S. Ilyin, A. G. Chuyko

RIF Corporation, Voronezh
Full-text PDF (93 kB)
DOI: https://doi.org/10.21883/FTP.2017.08.44777.46
Abstract: The Harman approach is used to develop a method and derive formulas for simultaneous determination of the thermoelectric efficiency for materials with $n$- or $p$-type of conductivity. The data for calculation are obtained from measurements of the voltage drop arising when direct and alternating current are consecutively passed through linear assemblies consisting of an odd number of branches of both types of conductivity.
Received: 31.01.2017
Accepted: 15.02.2017
English version:
Semiconductors, 2017, Volume 51, Issue 8, Pages 979–980
DOI: https://doi.org/10.1134/S1063782617080206
Bibliographic databases:
Document Type: Article
Language: Russian
Citation: Yu. P. Lebedev, A. S. Ivanov, A. S. Ilyin, A. G. Chuyko, “Determination of the thermoelectric efficiency of thermoelectric materials from measurements of linear series of branches for $n$- and $p$-types of conductivity”, Fizika i Tekhnika Poluprovodnikov, 51:8 (2017), 1021–1022; Semiconductors, 51:8 (2017), 979–980
Citation in format AMSBIB
\Bibitem{LebIvaIly17}
\by Yu.~P.~Lebedev, A.~S.~Ivanov, A.~S.~Ilyin, A.~G.~Chuyko
\paper Determination of the thermoelectric efficiency of thermoelectric materials from measurements of linear series of branches for $n$- and $p$-types of conductivity
\jour Fizika i Tekhnika Poluprovodnikov
\yr 2017
\vol 51
\issue 8
\pages 1021--1022
\mathnet{http://mi.mathnet.ru/phts6057}
\crossref{https://doi.org/10.21883/FTP.2017.08.44777.46}
\elib{https://elibrary.ru/item.asp?id=29938270}
\transl
\jour Semiconductors
\yr 2017
\vol 51
\issue 8
\pages 979--980
\crossref{https://doi.org/10.1134/S1063782617080206}
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