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This article is cited in 3 scientific papers (total in 3 papers)
XXI International Symposium ''Nanophysics And Nanoelectronics'', Nizhny Novgorod, March 13-16, 2017
Analysis of the GaN-HEMT parameters before and after gamma-neutron irradiation
E. A. Tarasova, S. V. Obolensky, O. E. Galkin, A. V. Hananova, A. B. Makarov Lobachevsky State University of Nizhny Novgorod
Abstract:
A method for mathematical processing of the results of measurements of the capacitance–voltage characteristics for an AlGaN/GaN HEMT (high electron mobility transistor) before and after $\gamma$-neutron irradiation with a fluence of 0.4 $\times$ 10$^{14}$ cm$^{-2}$ is suggested. The results of physical–topological simulation of an AlGaN/GaN HEMT on a SiC substrate are described. The error in calculating the GaN HEMT parameters due to inaccuracy in determining the electron distribution profile is determined.
Received: 27.04.2017 Accepted: 12.05.2017
Citation:
E. A. Tarasova, S. V. Obolensky, O. E. Galkin, A. V. Hananova, A. B. Makarov, “Analysis of the GaN-HEMT parameters before and after gamma-neutron irradiation”, Fizika i Tekhnika Poluprovodnikov, 51:11 (2017), 1543–1546; Semiconductors, 51:11 (2017), 1490–1494
Linking options:
https://www.mathnet.ru/eng/phts6005 https://www.mathnet.ru/eng/phts/v51/i11/p1543
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