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This article is cited in 4 scientific papers (total in 4 papers)
Semiconductor physics
Graphite/$p$-SiC Schottky diodes prepared by transferring drawn graphite films onto SiC
M. N. Solovana, G. O. Andrushchaka, A. I. Mostovyiab, T. T. Kovaliuka, V. V. Brusc, P. D. Mar'yanchuka a Chernivtsi National University named after Yuriy Fedkovych
b Department of Chemical Physics, Lund University, Lund, Sweden
c Institute for Silicon Photovoltaics, Helmholtz-Zentrum Berlin, Berlin, Germany
Abstract:
Graphite/$p$-SiC Schottky diodes are fabricated using the recently suggested technique of transferring drawn graphite films onto $p$-SiC single-crystal substrates. The current–voltage and capacitance–voltage characteristics are measured at different temperatures and at different frequencies of a small-signal AC signal, respectively. The temperature dependences of the potential-barrier height and of the series resistance of the graphite/$p$-SiC junctions are measured and analyzed. The dominant mechanisms of the charge–carrier transport through the diodes are determined. It is shown that the dominant mechanisms of the transport of charge carriers through the graphite/$p$-Si Schottky diodes at a forward bias are multi-step tunneling recombination and tunneling described by the Newman formula (at high bias voltages). At reverse biases, the dominant mechanisms of charge transport are the Frenkel–Poole emission and tunneling. It is shown that the graphite/$p$-SiC Schottky diodes can be used as detectors of ultraviolet radiation since they have the open-circuit voltage $V_{\operatorname{oc}}$ = 1.84 V and the short-circuit current density $I_{\operatorname{sc}}$ = 2.9 mA/cm$^2$ under illumination from a DRL 250-3 mercury–quartz lamp located 3 cm from the sample.
Received: 04.04.2017 Accepted: 10.04.2017
Citation:
M. N. Solovan, G. O. Andrushchak, A. I. Mostovyi, T. T. Kovaliuk, V. V. Brus, P. D. Mar'yanchuk, “Graphite/$p$-SiC Schottky diodes prepared by transferring drawn graphite films onto SiC”, Fizika i Tekhnika Poluprovodnikov, 52:2 (2018), 248–253; Semiconductors, 52:2 (2018), 236–241
Linking options:
https://www.mathnet.ru/eng/phts5924 https://www.mathnet.ru/eng/phts/v52/i2/p248
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Abstract page: | 38 | Full-text PDF : | 45 |
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