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This article is cited in 3 scientific papers (total in 3 papers)
Semiconductor physics
High-sensitivity photodetector based on atomically thin MoS$_{2}$
S. D. Lavrova, A. P. Shestakovaa, E. D. Mishinaa, Yu. R. Efimenkovb, A. S. Sigova a MIREA — Russian Technological University, Moscow
b Joint-Stock Company "Scientific and Production Enterprise Pulsar", Moscow
Abstract:
A design for a high-sensitivity photodetector with a single layer of MoS$_{2}$ transition-metal dichalcogenide used as the basic functional element is proposed and the process of its fabrication is presented step by step. Quality evaluation and the selection of functional MoS$_{2}$ flakes is based on the results of combined optical characterization. The main operating characteristics of the fabricated device are investigated and a photosensitivity of 1.4 mA/W is demonstrated. A difference of this device in comparison with existing analogues is its high photosensitivity at low operating voltages (in the range of $\pm$ 3 V).
Received: 08.06.2017 Accepted: 28.06.2017
Citation:
S. D. Lavrov, A. P. Shestakova, E. D. Mishina, Yu. R. Efimenkov, A. S. Sigov, “High-sensitivity photodetector based on atomically thin MoS$_{2}$”, Fizika i Tekhnika Poluprovodnikov, 52:6 (2018), 625–629; Semiconductors, 52:6 (2018), 771–775
Linking options:
https://www.mathnet.ru/eng/phts5813 https://www.mathnet.ru/eng/phts/v52/i6/p625
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