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This article is cited in 1 scientific paper (total in 1 paper)
Electronic properties of semiconductors
Photothreshold of an $\alpha$-GeS layered crystal: first-principles calculation
Z. A. Jahangirliab, F. M. Gashumzadea, D. A. Guseinovaa, B. G. Mehdiyeva, N. B. Mustafaeva a Institute of Physics Azerbaijan Academy of Sciences, Baku, Azerbaijan
b Azerbaijan Technical University, Baku
Abstract:
The photothreshold of an $\alpha$-GeS layered crystal is calculated from first principles based on the functional density method depending on its thickness. Two neighboring crystal plates consisting of several layers are separated by vacuum 4 layers thick, which corresponds to the doublet unit cell size of a bulk crystal. It is shown that the magnitude of the photothreshold is almost invariable with a crystal thickness larger than 10 layers.
Received: 04.04.2017 Accepted: 29.11.2017
Citation:
Z. A. Jahangirli, F. M. Gashumzade, D. A. Guseinova, B. G. Mehdiyev, N. B. Mustafaev, “Photothreshold of an $\alpha$-GeS layered crystal: first-principles calculation”, Fizika i Tekhnika Poluprovodnikov, 52:7 (2018), 699–701; Semiconductors, 52:7 (2018), 840–842
Linking options:
https://www.mathnet.ru/eng/phts5775 https://www.mathnet.ru/eng/phts/v52/i7/p699
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