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Fizika i Tekhnika Poluprovodnikov, 2018, Volume 52, Issue 10, Pages 1145–1149
DOI: https://doi.org/10.21883/FTP.2018.10.46454.8859
(Mi phts5708)
 

This article is cited in 4 scientific papers (total in 4 papers)

Micro- and nanocrystalline, porous, composite semiconductors

Simulation of electron and hole states in Si nanocrystals in a SiO$_{2}$ matrix: choice of parameters of the empirical tight-binding method

A. V. Belolipetskiy, M. O. Nestoklon, I. N. Yassievich

Ioffe Institute, St. Petersburg
Abstract: The problem of the optimal choice of parameters of the empirical tight-binding method to simulate the quantum-confined levels of Si nanocrystals embedded into an amorphous SiO$_{2}$ matrix is studied. To account for tunneling from nanocrystals to SiO$_{2}$, the amorphous matrix is considered as a virtual crystal with a band structure similar to that of SiO$_{2}$ $\beta$-cristobalite and with a lattice constant matched to the lattice constant of bulk Si. The electron density distributions in $\mathbf{k}$ space for electrons and holes quantum-confined in a Si nanocrystal in SiO$_{2}$ are calculated in a wide energy region, which provides a means to see clearly the possibility of the existence of efficient direct optical transitions for hot electrons at the upper quantum-confined levels.
Received: 12.03.2018
Accepted: 19.03.2018
English version:
Semiconductors, 2018, Volume 52, Issue 10, Pages 1264–1268
DOI: https://doi.org/10.1134/S1063782618100020
Bibliographic databases:
Document Type: Article
Language: Russian
Citation: A. V. Belolipetskiy, M. O. Nestoklon, I. N. Yassievich, “Simulation of electron and hole states in Si nanocrystals in a SiO$_{2}$ matrix: choice of parameters of the empirical tight-binding method”, Fizika i Tekhnika Poluprovodnikov, 52:10 (2018), 1145–1149; Semiconductors, 52:10 (2018), 1264–1268
Citation in format AMSBIB
\Bibitem{BelNesYas18}
\by A.~V.~Belolipetskiy, M.~O.~Nestoklon, I.~N.~Yassievich
\paper Simulation of electron and hole states in Si nanocrystals in a SiO$_{2}$ matrix: choice of parameters of the empirical tight-binding method
\jour Fizika i Tekhnika Poluprovodnikov
\yr 2018
\vol 52
\issue 10
\pages 1145--1149
\mathnet{http://mi.mathnet.ru/phts5708}
\crossref{https://doi.org/10.21883/FTP.2018.10.46454.8859}
\elib{https://elibrary.ru/item.asp?id=36903573}
\transl
\jour Semiconductors
\yr 2018
\vol 52
\issue 10
\pages 1264--1268
\crossref{https://doi.org/10.1134/S1063782618100020}
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  • https://www.mathnet.ru/eng/phts/v52/i10/p1145
  • This publication is cited in the following 4 articles:
    Citing articles in Google Scholar: Russian citations, English citations
    Related articles in Google Scholar: Russian articles, English articles
    Fizika i Tekhnika Poluprovodnikov Fizika i Tekhnika Poluprovodnikov
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