Current noise and efficiency droop of light-emitting diodes in defect-assisted carrier tunneling from an InGaN/GaN quantum well

The current dependences of the spectral noise density and quantum efficiency in green and blue light-emitting diodes with InGaN/GaN quantum wells (QWs) are measured. It is shown that the noise level greatly increases at high currents at which there is a quantum efficiency droop. The mechanism by which the current noise is formed is associated with hopping transport via the deep states of color centers in GaN across the n barrier of an InGaN/GaN QW. The source of the noise is the hopping resistance of the space-charge region, which limits the current of thermally activated electrons into the QW. The efficiency droop and the increase in noise level are attributed to a change in the electric-field direction near the QW at high injection levels and to an increase in the tunneling leakage of holes from the QW. It is shown that the experimental frequency-related noise spectra having the shape of a Lorentzian spectrum at the working currents are related to the frequency of hopping between deep centers near the InGaN/GaN QW and to Maxwell relaxation in the space-charge region.