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Fizika i Tekhnika Poluprovodnikov, 2019, Volume 53, Issue 5, Pages 702–705
DOI: https://doi.org/10.21883/FTP.2019.05.47567.25 (Mi phts5523) 		 
XVI International conference ''Thermoelectrics and their applications" - 2018 (ISCTA 2018), St. Petersburg, October, 2018

Setup for measuring the thermoelectric properties of ultrathin wires

O. N. Uryupin, A. A. Shabaldin

Ioffe Institute, St. Petersburg
Full-text PDF (348 kB)
DOI: https://doi.org/10.21883/FTP.2019.05.47567.25
Abstract: An experimental setup is developed to measure the thermoelectric properties of semiconductor nanowires with diameters of up to 5 nm in dielectric matrices. This setup makes it possible to measure the electrical resistance and thermoelectric power of nanostructured samples in the temperature range of 77–400 K.
Received: 20.12.2018
Revised: 24.12.2018
Accepted: 28.12.2018
English version:
Semiconductors, 2019, Volume 53, Issue 5, Pages 695–698
DOI: https://doi.org/10.1134/S1063782619050270
Bibliographic databases:
Document Type: Article
Language: Russian
Citation: O. N. Uryupin, A. A. Shabaldin, “Setup for measuring the thermoelectric properties of ultrathin wires”, Fizika i Tekhnika Poluprovodnikov, 53:5 (2019), 702–705; Semiconductors, 53:5 (2019), 695–698
Citation in format AMSBIB
\Bibitem{UrySha19}
\by O.~N.~Uryupin, A.~A.~Shabaldin
\paper Setup for measuring the thermoelectric properties of ultrathin wires
\jour Fizika i Tekhnika Poluprovodnikov
\yr 2019
\vol 53
\issue 5
\pages 702--705
\mathnet{http://mi.mathnet.ru/phts5523}
\crossref{https://doi.org/10.21883/FTP.2019.05.47567.25}
\elib{https://elibrary.ru/item.asp?id=37644661}
\transl
\jour Semiconductors
\yr 2019
\vol 53
\issue 5
\pages 695--698
\crossref{https://doi.org/10.1134/S1063782619050270}
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