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This article is cited in 6 scientific papers (total in 6 papers)
Manufacturing, processing, testing of materials and structures
Submonolayer InGaAs/GaAs quantum dots grown by MOCVD
V. Ya. Aleshkina, N. V. Baidusb, A. A. Dubinova, K. E. Kudryavtseva, S. M. Nekorkinb, A. V. Kruglovb, D. G. Reunovb a Institute for Physics of Microstructures, Russian Academy of Sciences, Nizhnii Novgorod
b National Research Lobachevsky State University of Nizhny Novgorod
Abstract:
The mode of the growth of InGaAs quantum dots by MOS-hydride epitaxy on GaAs substrates without a deviation and with a deviation of 2$^{\circ}$ is selected for laser structures emitting at wavelengths above 1.2 $\mu$m at room temperature. As a result, a quantum-dot density of 4 $\times$ 10$^{10}$ cm$^{-2}$ is achieved. Stimulated emission is observed in laser structures with seven layers of quantum dots at a wavelength of 1.06 $\mu$m at liquid-nitrogen temperature. The threshold power density of optical pumping is about 5 kW/cm$^2$.
Keywords:
quantum dots, MOS-hydride epitaxy, GaAs/InGaAs.
Received: 01.04.2019 Revised: 11.04.2019 Accepted: 11.04.2019
Citation:
V. Ya. Aleshkin, N. V. Baidus, A. A. Dubinov, K. E. Kudryavtsev, S. M. Nekorkin, A. V. Kruglov, D. G. Reunov, “Submonolayer InGaAs/GaAs quantum dots grown by MOCVD”, Fizika i Tekhnika Poluprovodnikov, 53:8 (2019), 1159–1163; Semiconductors, 53:8 (2019), 1138–1142
Linking options:
https://www.mathnet.ru/eng/phts5445 https://www.mathnet.ru/eng/phts/v53/i8/p1159
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