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Fizika i Tekhnika Poluprovodnikov, 2019, Volume 53, Issue 8, Pages 1122–1127
DOI: https://doi.org/10.21883/FTP.2019.08.48005.9098 (Mi phts5439) 		 
This article is cited in 2 scientific papers (total in 2 papers)

Semiconductor physics

Evaluation of the impact of surface recombination in microdisk lasers by means of high-frequency modulation

A. E. Zhukovab, È. I. Moiseeva, N. V. Kryzhanovskayaab, S. A. Blokhinc, M. M. Kulaginac, Yu. A. Gusevac, S. A. Mintairovac, N. A. Kalyuzhnyyac, A. M. Mozharova, F. I. Zubova, M. V. Maksimova

a Federal State Budgetary Institution of Higher Education and Science Saint Petersburg National Research Academic University of the Russian Academy of Sciences, St. Petersburg
b Peter the Great St. Petersburg Polytechnic University
c Ioffe Institute, St. Petersburg
Full-text PDF (398 kB) Citations (2)
DOI: https://doi.org/10.21883/FTP.2019.08.48005.9098
Abstract: Microdisk lasers 10–30 $\mu$m in diameter operating at room temperature without thermal stabilization and with an active region based on nanostructures of hybrid dimensionality–quantum wells–dots–are investigated. High-frequency measurements of the microlaser response are performed in the direct small-signal modulation mode, which makes it possible to establish the parameters of the operating speed and analyze their dependence on the microlaser diameter. It is found that the K factor is (0.8 $\pm$ 0.2) ns, which corresponds to optical losses of $\sim$6 cm$^{-1}$, and no regular dependence on the diameter is observed. It is found that the low-frequency component of the damping coefficient of relaxation oscillations is inversely proportional to the diameter. This character of the dependence evidences a decrease in the carrier lifetime in small-diameter microcavities, which can be associated with the prevalence of nonradiative recombination on their side walls.
Keywords: microcavity, microlaser, surface recombination, high-frequency modulation.
Funding agency Grant number
Russian Science Foundation 18-12-00287
Ministry of Education and Science of the Russian Federation 3.9796.2017/8.9
16.2593.2017/4.6
This study was supported by the Russian Scientific Foundation, project no. 18-12-00287. Planarization of microdisks (A.M.M.) was developed and performed with support of the Ministry of Science and Education of the Russian Federation, projects nos. 3.9796.2017/8.9 and 16.2593.2017/4.6.
Received: 11.03.2019
Revised: 18.03.2019
Accepted: 18.03.2019
English version:
Semiconductors, 2019, Volume 53, Issue 8, Pages 1099–1103
DOI: https://doi.org/10.1134/S1063782619080220
Bibliographic databases:
Document Type: Article
Language: Russian
Citation: A. E. Zhukov, È. I. Moiseev, N. V. Kryzhanovskaya, S. A. Blokhin, M. M. Kulagina, Yu. A. Guseva, S. A. Mintairov, N. A. Kalyuzhnyy, A. M. Mozharov, F. I. Zubov, M. V. Maksimov, “Evaluation of the impact of surface recombination in microdisk lasers by means of high-frequency modulation”, Fizika i Tekhnika Poluprovodnikov, 53:8 (2019), 1122–1127; Semiconductors, 53:8 (2019), 1099–1103
Citation in format AMSBIB
\Bibitem{ZhuMoiKry19}
\by A.~E.~Zhukov, \`E.~I.~Moiseev, N.~V.~Kryzhanovskaya, S.~A.~Blokhin, M.~M.~Kulagina, Yu.~A.~Guseva, S.~A.~Mintairov, N.~A.~Kalyuzhnyy, A.~M.~Mozharov, F.~I.~Zubov, M.~V.~Maksimov
\paper Evaluation of the impact of surface recombination in microdisk lasers by means of high-frequency modulation
\jour Fizika i Tekhnika Poluprovodnikov
\yr 2019
\vol 53
\issue 8
\pages 1122--1127
\mathnet{http://mi.mathnet.ru/phts5439}
\crossref{https://doi.org/10.21883/FTP.2019.08.48005.9098}
\elib{https://elibrary.ru/item.asp?id=41129843}
\transl
\jour Semiconductors
\yr 2019
\vol 53
\issue 8
\pages 1099--1103
\crossref{https://doi.org/10.1134/S1063782619080220}
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