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This article is cited in 4 scientific papers (total in 4 papers)
Electronic properties of semiconductors
Effect of X-ray radiation on the optical properties of photorefractive bismuth-silicate crystals
V. T. Avanesyan, I. V. Piskovatskova, V. M. Stozharov Herzen State Pedagogical University of Russia, St. Petersburg
Abstract:
The results of investigations of the optical-absorption spectra of bismuth-silicate (Bi$_{12}$SiO$_{20}$) single crystals are presented. The band-gap width and the characteristic Urbach energy are determined. The effect of preliminary X-ray irradiation on the behavior of the experimental spectral dependences and the values of the characteristic parameters induced by the bismuth-silicate defect structure is established.
Keywords:
bismuth silicate, sillenite, spectral dependence, optical absorption.
Received: 26.03.2019 Revised: 05.04.2019 Accepted: 08.04.2019
Citation:
V. T. Avanesyan, I. V. Piskovatskova, V. M. Stozharov, “Effect of X-ray radiation on the optical properties of photorefractive bismuth-silicate crystals”, Fizika i Tekhnika Poluprovodnikov, 53:8 (2019), 1043–1046; Semiconductors, 53:8 (2019), 1024–1027
Linking options:
https://www.mathnet.ru/eng/phts5426 https://www.mathnet.ru/eng/phts/v53/i8/p1043
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