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This article is cited in 1 scientific paper (total in 1 paper)
Semiconductor physics
Impact of high energy elctron irradiation on surge currents in 4$H$-SiC JBS Schottky diodes
A. A. Lebedeva, V. V. Kozlovskyb, P. A. Ivanova, M. E. Levinshteĭna, A. V. Zubovc a Ioffe Institute, St. Petersburg
b Peter the Great St. Petersburg Polytechnic University
c St. Petersburg National Research University of Information Technologies, Mechanics and Optics
Abstract:
The effect of high energy (0.9 MeV) electron irradiation on surge currents of high-voltage 4$H$-SiC JBS was investigated in the microsecond range of the forward current pulses duration. With irradiation dose $\Phi$ growth, the threshold of hole injection monotonically increases, and the base modulation level by minority carriers (holes) decreases. At $\Phi$ = 1.5 $\times$ 10$^{16}$ cm$^{-2}$, the hole injection is not observed up to forward voltage values of $\sim$30 V and forward current density $j\approx$ 9000 A/cm$^2$.
Keywords:
silicon carbide, Schottky diodes, electron irradiation, surge currents.
Received: 16.05.2019 Revised: 24.05.2019 Accepted: 24.05.2019
Citation:
A. A. Lebedev, V. V. Kozlovsky, P. A. Ivanov, M. E. Levinshteǐn, A. V. Zubov, “Impact of high energy elctron irradiation on surge currents in 4$H$-SiC JBS Schottky diodes”, Fizika i Tekhnika Poluprovodnikov, 53:10 (2019), 1448–1452; Semiconductors, 53:10 (2019), 1409–1413
Linking options:
https://www.mathnet.ru/eng/phts5395 https://www.mathnet.ru/eng/phts/v53/i10/p1448
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