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This article is cited in 2 scientific papers (total in 2 papers)
Manufacturing, processing, testing of materials and structures
Changes in the photoluminescence properties of semiconductor heterostructures after ion-beam etching
Ya. V. Levitskii, M. I. Mitrofanov, G. V. Voznyuk, D. N. Nikolaev, M. N. Mizerov, V. P. Evtikhiev Ioffe Institute, St. Petersburg
Abstract:
The ion-beam etching of AlGaAs/GaAs heterostructures gives rise to radiation defects and, as a result, leads to photoluminescence quenching. Annealing at 620°C in an atmosphere of As almost completely restores the quantum efficiency of photoluminescence in the case of radiation-induced defects lying at a distance of up to 150 nm from the heterointerface.
Keywords:
focused ion beam, direct ion lithography, nanolithography, radiation defects, annealing, microphotoluminescence.
Received: 22.04.2019 Revised: 11.05.2019 Accepted: 13.05.2019
Citation:
Ya. V. Levitskii, M. I. Mitrofanov, G. V. Voznyuk, D. N. Nikolaev, M. N. Mizerov, V. P. Evtikhiev, “Changes in the photoluminescence properties of semiconductor heterostructures after ion-beam etching”, Fizika i Tekhnika Poluprovodnikov, 53:11 (2019), 1579–1583; Semiconductors, 53:11 (2019), 1545–1549
Linking options:
https://www.mathnet.ru/eng/phts5368 https://www.mathnet.ru/eng/phts/v53/i11/p1579
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Abstract page: | 42 | Full-text PDF : | 15 |
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