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This article is cited in 4 scientific papers (total in 4 papers)
Spectroscopy, interaction with radiation
Luminescent properties of float zone silicon irradiated with swift heavy ions
S. G. Cherkovaa, V. A. Skuratovbcd, V. A. Volodinae a Rzhanov Institute of Semiconductor Physics, Siberian Branch of Russian Academy of Sciences, Novosibirsk
b Joint Institute for Nuclear Research, Dubna, Moscow region
c Dubna State University, Dubna, Moscow Reg.
d National Engineering Physics Institute "MEPhI", Moscow
e Novosibirsk State University
Abstract:
The float zone (high-resistance) silicon irradiated with swift heavy ions was studied by photoluminescence (PL) spectroscopy method. In addition to well-known X, W, W', R and C lines, a broad peak (1.3 – 1.5 $\mu$m) appears in PL spectra at low-temperatures. As the irradiation dose increases from 3$\cdot$10$^{11}$–10$^{13}$ cm$^{-2}$, the PL intensity decreases by about an order of magnitude, also a narrowing of the peak with red-shift is observed.
Keywords:
photoluminescence, defects in silicon, swift heavy ions.
Received: 16.04.2019 Revised: 15.05.2019 Accepted: 17.06.2019
Citation:
S. G. Cherkova, V. A. Skuratov, V. A. Volodin, “Luminescent properties of float zone silicon irradiated with swift heavy ions”, Fizika i Tekhnika Poluprovodnikov, 53:11 (2019), 1467–1470; Semiconductors, 53:11 (2019), 1427–1430
Linking options:
https://www.mathnet.ru/eng/phts5350 https://www.mathnet.ru/eng/phts/v53/i11/p1467
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