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This article is cited in 5 scientific papers (total in 5 papers)
Semiconductor physics
High-power 4$H$-SiC mosfet with an epitaxial buried channel
A. I. Mikhaylova, A. V. Afanasyeva, V. A. Ilyina, V. V. Luchinina, S. A. Reshanovb, A. Schönerb a Saint Petersburg Electrotechnical University "LETI"
b Ascatron AB, Kista, Sweden
Abstract:
A method for reducing the on-state resistance of a high-power 4$H$-SiC metal-oxide-semiconductor field-effect transistor (MOSFET) by forming a buried channel via the growth of epitaxial layers on the surface of the heavily doped $p$-region is proposed. The features of the carrier transport in the epitaxial buried channel are considered in comparison with that fabricated by conventional technology. A more than threefold decrease in the resistance of the high-power MOSFET is achieved.
Keywords:
4$H$-SiC, epitaxy, transistor channel, MOSFET.
Received: 04.09.2019 Revised: 16.09.2019 Accepted: 16.09.2019
Citation:
A. I. Mikhaylov, A. V. Afanasyev, V. A. Ilyin, V. V. Luchinin, S. A. Reshanov, A. Schöner, “High-power 4$H$-SiC mosfet with an epitaxial buried channel”, Fizika i Tekhnika Poluprovodnikov, 54:1 (2020), 79–84; Semiconductors, 54:1 (2020), 122–126
Linking options:
https://www.mathnet.ru/eng/phts5311 https://www.mathnet.ru/eng/phts/v54/i1/p79
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